Invention Grant
- Patent Title: Apparatus and method for measuring power supply noise
- Patent Title (中): 用于测量电源噪声的装置和方法
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Application No.: US14710466Application Date: 2015-05-12
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Publication No.: US09596037B2Publication Date: 2017-03-14
- Inventor: Tzu-Chien Hsueh , Frank O'Mahony
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Green, Howard, & Mughal, LLP
- Main IPC: H04B15/00
- IPC: H04B15/00 ; H04B17/10 ; G01R31/317 ; G01R31/28

Abstract:
Described is an apparatus which comprises: a power delivery distribution network (PDN) to provide a power supply to at least one circuit; and an on-die synchronous power supply noise injector to inject noise to the power supply on the PDN. Described is another apparatus which comprises: a PDN to provide power supply to various circuits; an on-die power supply noise (PSN) sampler to sample the power supply with an injected noise, wherein the PSN sampler to sample the power supply with at least two different clock signals; and a phase noise accumulator to randomize the periods of the at least two different clock signals.
Public/Granted literature
- US20160337048A1 APPARATUS AND METHOD FOR MEASURING POWER SUPPLY NOISE Public/Granted day:2016-11-17
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