Invention Grant
- Patent Title: Electronic device having a delay locked loop, and memory device having the same
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Application No.: US14955051Application Date: 2015-12-01
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Publication No.: US09654093B2Publication Date: 2017-05-16
- Inventor: Won-Joo Yun , Yong Shim
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- Assignee: SAMSUNG ELECTRONICS CO, LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO, LTD.
- Current Assignee Address: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- Agency: Muir Patent Law, PLLC
- Priority: KR10-2014-0169579 20141201
- Main IPC: H03L7/06
- IPC: H03L7/06 ; H03K7/08 ; H03L7/085 ; H03K5/156

Abstract:
An electronic device includes a first duty cycle correction circuit, a delay line, a second duty cycle correction circuit, and a delay control circuit. The first duty cycle correction circuit is configured to detect a duty cycle error of a clock signal by performing time-to-digital conversion on the clock signal, and to generate a corrected clock signal by adjusting a duty cycle of the clock signal based on the duty cycle error of the clock signal. The delay line is configured to generate a delayed corrected clock signal by delaying the corrected clock signal based on a delay control code The second duty cycle correction circuit is configured to detect a duty cycle error of a first output clock signal received through a feedback loop, and to generate a second output clock signal by adjusting duty cycle of the delayed corrected clock signal based on the duty cycle error of the first output clock signal. The delay control circuit is configured to generate the delay control code based on the clock signal and the first output clock signal.
Public/Granted literature
- US20160156342A1 ELECTRONIC DEVICE HAVING A DELAY LOCKED LOOP, AND MEMORY DEVICE HAVING THE SAME Public/Granted day:2016-06-02
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