Invention Grant
- Patent Title: Automatic analyzer
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Application No.: US14415300Application Date: 2013-06-13
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Publication No.: US09658237B2Publication Date: 2017-05-23
- Inventor: Tomonori Mimura , Akihisa Makino , Manabu Ando , Sakuichiro Adachi
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2012-161629 20120720
- International Application: PCT/JP2013/066377 WO 20130613
- International Announcement: WO2014/013820 WO 20140123
- Main IPC: G01N35/02
- IPC: G01N35/02 ; G01N21/31 ; G01N21/13 ; G01N21/49 ; G01N21/51 ; G01N21/53 ; G01N21/59 ; G01N35/00 ; G01N21/27 ; G01N35/04

Abstract:
There is provided an automatic analyzer including: a sample pipetting mechanism 7, reagent pipetting mechanisms 12A and 12B, mixing mechanisms 33A and 33B, a scattered light photometer 40, and an absorption photometer 41 all located on a transfer path of reaction cells 2 arranged circumferentially on a disk-shaped reaction disk 1, the reaction cells 2 being transferred in the circumferential direction by rotation of the reaction disk 1. Scattered light intensity and absorbance are controlled to be measured by causing the reaction cells 2 to move past a scattered light detection position and a transmitted light detection position in the same process of movement, the two positions being established beforehand on the transfer path. This makes it possible to suppress the effects on measurement results of the difference in time between scattered light measurement and absorbance measurement thereby improving measurement accuracy.
Public/Granted literature
- US20150185242A1 AUTOMATIC ANALYZER Public/Granted day:2015-07-02
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