Invention Grant
- Patent Title: Handler apparatus, adjustment method of handler apparatus, and test apparatus
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Application No.: US14472388Application Date: 2014-08-29
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Publication No.: US09658287B2Publication Date: 2017-05-23
- Inventor: Tsuyoshi Yamashita , Mitsunori Aizawa , Hiromitsu Horino , Yuya Yamada , Masataka Onozawa
- Applicant: ADVANTEST CORPORATION
- Applicant Address: JP Tokyo
- Assignee: ADVANTEST CORPORATION
- Current Assignee: ADVANTEST CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: KR2014-0034379 20140325
- Main IPC: G01R31/20
- IPC: G01R31/20 ; G01R31/28 ; G01C11/00 ; G01R1/04

Abstract:
A handler apparatus adjusts a position of an actuator and enhances positional accuracy of a device under test. Provided is a handler apparatus that conveys a device under test to a test socket, including: an actuator that, prior to fitting of a device holder holding the device under test to the test socket, fits the device holder, and adjusts a position of the device under test on the device holder; and an actuator adjusting section that adjusts an amount of driving of the actuator by causing the actuator to fit an actuator fitting unit.
Public/Granted literature
- US20150276861A1 HANDLER APPARATUS, ADJUSTMENT METHOD OF HANDLER APPARATUS, AND TEST APPARATUS Public/Granted day:2015-10-01
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