Invention Grant
- Patent Title: On-chip resistance measurement circuit and resistive memory device including the same
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Application No.: US14660530Application Date: 2015-03-17
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Publication No.: US09659641B2Publication Date: 2017-05-23
- Inventor: Chan-Kyung Kim , Kee-Won Kwon
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Yeongtong-gu, Suwon-si, Gyeonggi-do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Yeongtong-gu, Suwon-si, Gyeonggi-do
- Agency: Muir Patent Law, PLLC
- Priority: KR10-2014-0073453 20140617
- Main IPC: G11C13/00
- IPC: G11C13/00 ; G11C11/16 ; G11C11/56

Abstract:
A resistive memory device may include a resistive cell array and an on-chip resistance measurement circuit. The resistive cell array may include a plurality of resistive memory cells. The on-chip resistance measurement circuit may be configured to generate a first current and a second current greater or less than the first current based on a cell current corresponding to a cell resistance of a first memory cell of the resistive memory cells, and to generate first and second digital signals based on the first and second current, respectively.
Public/Granted literature
- US20150364187A1 ON-CHIP RESISTANCE MEASUREMENT CIRCUIT AND RESISTIVE MEMORY DEVICE INCLUDING THE SAME Public/Granted day:2015-12-17
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