Invention Grant
- Patent Title: Dynamic measurement of frequency synthesizer noise spurs or phase noise
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Application No.: US14588079Application Date: 2014-12-31
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Publication No.: US09696359B2Publication Date: 2017-07-04
- Inventor: Karthik Subburaj , Sreekiran Samala , Raghu Ganesan
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Ronald O. Neerings; Charles A. Brill; Frank D. Cimino
- Main IPC: G01R29/26
- IPC: G01R29/26 ; H03L7/06 ; G01S7/03 ; G01S7/40 ; G01S13/34 ; G01S13/93

Abstract:
A method of measuring phase noise (PN). A PLL frequency synthesizer is provided including a first phase frequency detector (PFD) receiving a reference frequency signal coupled to a first charge pump (CP) coupled to a VCO having an output fedback to the first PFD through a feedback divider that provides a divided frequency signal to the first PFD which outputs an error signal, and PN measurement circuitry including a replica CP coupled to an output of a second PFD or the first PFD. The error signal is received at the replica CP or the divided and reference frequency signal are received at the second PFD, wherein the replica CP outputs a scaled phase error current which is current-to-voltage converted and amplified to provide an amplified phase error voltage, and digitized to provide a digital phase error signal. The digital phase error signal is frequency analyzed to generate a PN measurement.
Public/Granted literature
- US20160191232A1 DYNAMIC MEASUREMENT OF FREQUENCY SYNTHESIZER NOISE SPURS OR PHASE NOISE Public/Granted day:2016-06-30
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