Invention Grant
- Patent Title: Optimal read threshold estimation
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Application No.: US14937833Application Date: 2015-11-10
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Publication No.: US09741431B2Publication Date: 2017-08-22
- Inventor: Naveen Kumar , Frederick K. H. Lee , Christopher S. Tsang , Lingqi Zeng
- Applicant: SK hynix memory solutions inc.
- Applicant Address: US CA San Jose
- Assignee: SK hynix memory solutions Inc.
- Current Assignee: SK hynix memory solutions Inc.
- Current Assignee Address: US CA San Jose
- Agency: IP & T Group LLP
- Main IPC: G11C11/56
- IPC: G11C11/56 ; G11C16/26 ; G11C16/04 ; G11C16/34 ; G11C29/02

Abstract:
An optimal read threshold estimation method includes determining a flip difference corresponding to an optimal step size Δopt, estimating a first slope m1 at a first read point and a second slope m2 at a second read point, and obtaining an optimal read threshold (XLPopt) as the intersection of a first line with the first slope m1 and a second line with the second slope m2.
Public/Granted literature
- US20160133333A1 OPTIMAL READ THRESHOLD ESTIMATION Public/Granted day:2016-05-12
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