Invention Grant
- Patent Title: Calibration of microscopy systems
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Application No.: US14469362Application Date: 2014-08-26
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Publication No.: US09797767B2Publication Date: 2017-10-24
- Inventor: Alex David Corwin , Christine Lynne Pitner , David Andrew Shoudy , Kevin Bernard Kenny
- Applicant: GENERAL ELECTRIC COMPANY
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Pabitra K. Chakrabarti
- Main IPC: G02B21/36
- IPC: G02B21/36 ; G01J1/02 ; G01N21/64 ; G01N21/27

Abstract:
Approaches are disclosed for calibrating a plurality of imaging devices, such as microscopes. In certain implementations, a calibration plate is employed that include a variety of calibration features. Imaging devices calibrated in accordance with the present approaches may be used to generate images having consistent attributes, such as brightness, regardless of which imaging device is employed.
Public/Granted literature
- US20160061654A1 CALIBRATION OF MICROSCOPY SYSTEMS Public/Granted day:2016-03-03
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