Invention Grant
- Patent Title: Advance manufacturing monitoring and diagnostic tool
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Application No.: US14141653Application Date: 2013-12-27
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Publication No.: US09797993B2Publication Date: 2017-10-24
- Inventor: Gerald W. Pauly , Walter J. Keller, III
- Applicant: Gerald W. Pauly , Walter J. Keller, III
- Applicant Address: US PA Charleroi
- Assignee: Nokomis, Inc.
- Current Assignee: Nokomis, Inc.
- Current Assignee Address: US PA Charleroi
- Agency: James Ray and Assocs
- Agent Alexander Pokot
- Main IPC: G01S7/41
- IPC: G01S7/41 ; G01R31/01 ; G01R31/26 ; G01R31/317 ; G01R29/08 ; G01R31/28 ; G01R31/265 ; G01R31/302

Abstract:
A device and a method for monitoring and analysis utilize unintended electromagnetic emissions of electrically powered components, devices or systems. The emissions are received at the antenna and a receiver. A processor processes and measures change or changes in a signature of the unintended electromagnetic emissions. The measurement are analyzed to both record a baseline score for future measurements and to be used in determining status and/or health of the analyzed system or component.
Public/Granted literature
- US20140218229A1 ADVANCE MANUFACTURING MONITORING AND DIAGNOSTIC TOOL Public/Granted day:2014-08-07
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