- 专利标题: Method of fabricating multi-substrate semiconductor devices
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申请号: US14940621申请日: 2015-11-13
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公开(公告)号: US09865581B2公开(公告)日: 2018-01-09
- 发明人: Joo-Hee Jang , Pil-Kyu Kang , Seok-Ho Kim , Tae-Yeong Kim , Hyo-Ju Kim , Byung-Lyul Park , Jum-Yong Park , Jin-Ho An , Kyu-Ha Lee , Yi-Koan Hong
- 申请人: Samsung Electronics Co., Ltd.
- 申请人地址: KR
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR
- 代理机构: Myers Bigel, P.A.
- 优先权: KR10-2014-0157801 20141113
- 主分类号: H01L25/00
- IPC分类号: H01L25/00 ; H01L23/532 ; H01L21/768 ; H01L27/146
摘要:
A first insulating layer is formed on a substrate. An opening is formed in the first insulating layer. A barrier layer is formed on the first insulating layer and conforming to sidewalls of the first insulating layer in the opening, and a conductive layer is formed on the barrier layer. Chemical mechanical polishing is performed to expose the first insulating layer and leave a barrier layer pattern in the opening and a conductive layer pattern on the barrier layer pattern in the opening, wherein a portion of the conductive layer pattern protrudes above an upper surface of the insulating layer and an upper surface of the barrier layer pattern. A second insulating layer is formed on the first insulating layer, the barrier layer pattern and the conductive layer pattern and planarized to expose the conductive layer pattern. A second substrate may be bonded to the exposed conductive layer pattern.
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