Invention Grant
- Patent Title: Quantum dot image sensor
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Application No.: US14882832Application Date: 2015-10-14
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Publication No.: US09881955B2Publication Date: 2018-01-30
- Inventor: Dajiang Yang , Gang Chen , Duli Mao , Dyson H. Tai
- Applicant: OMNIVISION TECHNOLOGIES, INC.
- Applicant Address: US CA Santa Clara
- Assignee: OmniVision Technologies, Inc.
- Current Assignee: OmniVision Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Christensen O'Connor Johnson Kindness PLLC
- Main IPC: H04N5/335
- IPC: H04N5/335 ; H01L27/146

Abstract:
A photodetector includes a first doped region disposed in a semiconductor material and a second doped region disposed in the semiconductor material. The second doped region is electrically coupled to the first doped region, and the second doped region is of an opposite majority charge carrier type as the first doped region. The photodetector also includes a quantum dot layer disposed in a trench in the semiconductor material, and the quantum dot layer is electrically coupled to the second doped region. A transfer gate is disposed to permit charge transfer from the second doped region to a floating diffusion.
Public/Granted literature
- US20170110608A1 QUANTUM DOT IMAGE SENSOR Public/Granted day:2017-04-20
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