Invention Application
- Patent Title: ERROR CONTROL FOR MEMORY DEVICE
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Application No.: PCT/US2021/033457Application Date: 2021-05-20
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Publication No.: WO2021252163A1Publication Date: 2021-12-16
- Inventor: YAMAMOTO, Nobuo , MORGAN, Donald, Martin , WONG, Victor , KWAK, Jongtae
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: 8000 S. Federal Way
- Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee Address: 8000 S. Federal Way
- Agency: CLOUSE, Ian
- Priority: US16/895,960 2020-06-08
- Main IPC: G11C11/22
- IPC: G11C11/22 ; G06F11/10 ; G11C11/221 ; G11C11/401 ; G11C16/10 ; G11C16/26 ; G11C29/20 ; G11C29/42 ; G11C29/44
Abstract:
Methods, systems, and devices for error control for memory device are described. A memory device may be configured to perform memory management operations including error control operations. For example, a memory device may be configured to perform an error control operation on data stored in a first memory cell coupled with a source row of a memory array. The memory device may be configured to write the data to a second memory cell coupled with the target row of the memory array based on performing the error control operation on the data and determine whether the management operation is complete based at least in part on the first column address of the first memory cell. The memory device may also generate an output signal to perform the error control operation on a third memory cell coupled with the source row based on determining whether the management operation is complete.
Information query