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61 条记录 (耗时 0.016 秒)

    HEADPHONE
    2.
    发明公开
    HEADPHONE 审中-公开

    公开(公告)号：EP3468221A1

    公开(公告)日：2019-04-10

    申请号：EP18196137.6

    申请日：2018-09-24

    申请人： Rion Co., Ltd.

    发明人： ISHIKAWA, Shinichi ,  YAMASAKI, Takashi ,  NAGAMINE, Kenichi ,  MANO, Takashi

    IPC分类号： H04R1/10 ,  H04R1/28

    摘要： A headphone includes: a sound source configured to convert an electric signal into a sound and to output the sound; a body portion covering a back surface of the sound source and holding the sound source; an ear pad which is configured to surround the pinna of a wearer, and which forms an air space between the wearer's head and the sound source when the headphone is worn; a sound absorbing material disposed opposing the sound source at a front surface of the sound source in the air space; and a holder holding the ear pad and the sound absorbing material. The holder is attachable to and detachable from the body portion.

    ELECTROMECHANICAL TRANSDUCER
    3.
    发明授权
    ELECTROMECHANICAL TRANSDUCER 有权

    公开(公告)号：EP3211919B1

    公开(公告)日：2018-12-26

    申请号：EP17157361.1

    申请日：2017-02-22

    申请人： Rion Co., Ltd.

    发明人： IWAKURA, Takashi

    IPC分类号： H04R11/02 ,  H02K33/02 ,  H04R25/00

    CPC分类号： H02K33/02 ,  H04R11/02 ,  H04R25/00

    摘要： An electromechanical transducer of the invention comprises a structural unit, an armature, and the first and second elastic units. The structural unit includes magnets, a yoke and a coil. The armature includes an inner portion disposed to pass through inside the structural unit and two outer portions protruding from the inner portion in a first direction, and the armature constitutes a magnetic circuit with the structural unit via two regions through which components of the magnetic flux flow in reverse directions in the inner region. The elastic units give restoring forces to the outer portions in response to displacement of the armature due to magnetic forces of the magnetic circuit. In the armature, a cross-sectional area at a predetermined position between the two regions is smaller than that at the two regions, and magnetic flux flowing in the first direction within a range of displacement of the armature.

    PARTICLE MEASURING APPARATUS
    7.
    发明公开
    PARTICLE MEASURING APPARATUS 审中-公开
    TEILCHENMESSVORRICHTUNG

    公开(公告)号：EP1980837A1

    公开(公告)日：2008-10-15

    申请号：EP07707691.7

    申请日：2007-01-30

    申请人： National University Corporation Kanazawa University ,  Rion Co., Ltd.

    发明人： OTANI, Yoshio ,  ICHIJO, Kazuo

    IPC分类号： G01N15/02 ,  G01N15/06

    CPC分类号： G01N15/06 ,  G01N15/065 ,  G01N15/0656 ,  G01N15/1459 ,  G01N35/1095 ,  G01N2015/1062 ,  G01N2015/1486

    摘要： The object of the present invention is to provide a particle counter which can accurately count the number of particles contained in fluid where the number concentration of particles is high. The particle counter includes a particle removing portion for removing particles contained in fluid at a predetermined rate, a sensor portion for counting the particles passing through the particle removing portion, and a particle number correcting means comprising a characteristic data memory and a digital signal processor for performing correction processing to the number of the particles counted in the sensor portion by using removal characteristics of the particle removing portion with respect to the particle diameter.

    摘要翻译： 本发明的目的是提供一种粒子计数器，其可以精确地计数流体中包含的颗粒的数量，其中颗粒的数量浓度高。 颗粒计数器包括用于以预定速率去除包含在流体中的颗粒的颗粒去除部分，用于计数通过颗粒去除部分的颗粒的传感器部分，以及包括特征数据存储器和数字信号处理器的颗粒数校正装置， 通过使用颗粒除去部分相对于粒径的去除特性，对传感器部分中计数的颗粒数进行校正处理。

    PARTICLE MEASURING DEVICE, CALIBRATION METHOD, AND MEASURING DEVICE
    8.
    发明公开
    PARTICLE MEASURING DEVICE, CALIBRATION METHOD, AND MEASURING DEVICE 审中-公开

    公开(公告)号：EP3862742A1

    公开(公告)日：2021-08-11

    申请号：EP19869892.0

    申请日：2019-09-30

    申请人： NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY ,  RION Co., Ltd. ,  Kioxia Corporation

    发明人： KATO, Haruhisa ,  MATSUURA, Yusuke ,  NAKAMURA, Ayako ,  KONDO, Kaoru ,  TABUCHI, Takuya ,  TOMITA, Hiroshi ,  HAYASHI, Hidekazu

    IPC分类号： G01N15/02 ,  G01N15/00

    摘要： To easily calibrate, using a calibration particle, a measuring device configured to capture an image of a target object such as a target particle. An image analyzer (21) acquires multiple images obtained at a predetermined time interval Δt, (a) specifies the mean-square displacement Δ MS-cal of a bright point of a calibration particle based on the displacement, in terms of a pixel unit, of the bright point of the calibration particle in the multiple images in a calibration mode, and (b) specifies the mean-square displacement Δ MS of a bright point of the target particle based on the displacement, in terms of the pixel unit, of the bright point of the target particle in the multiple images in a measuring mode. A particle size analyzer (22), (c) in the analysis mode, derives the particle size d of the target particle from the mean-square displacement Δ MS of the bright point of the target particle based on the mean-square displacement Δ MS-cal of the bright point of the calibration particle and the particle size d cal of the calibration particle.