MULTIPLE ANGLES OF INCIDENCE SEMICONDUCTOR METROLOGY SYSTEMS AND METHODS
    1.
    发明公开
    MULTIPLE ANGLES OF INCIDENCE SEMICONDUCTOR METROLOGY SYSTEMS AND METHODS 审中-公开
    HALBLEITERMETROLOGIESYSTEME MIT MEHREREN EINFALLSWINKELN UND VERFAHREN

    公开(公告)号:EP3047520A4

    公开(公告)日:2017-07-12

    申请号:EP14843577

    申请日:2014-09-15

    申请人: KLA-TENCOR CORP

    摘要: An apparatus includes (i) a bright light source for providing an illumination beam at multiple wavelengths selectable with a range from a deep ultraviolet wavelength to an infrared wavelength, (ii) illumination optics for directing the illumination beam towards a sample at selectable sets of angles of incidence (AOI's) or azimuth angles (AZ's) and polarization states to provide spectroscopic ellipsometry, wherein the illumination optics include an apodizer for controlling a spot size of the illumination beam on the sample at each of the selectable AOI/AZ sets, (iii) collection optics for directing an output beam from the sample in response to the illumination beam at each of the selectable AOI/AZ sets and polarization states towards a detector that generates an output signal or image based on the output beam, and (v) a controller for characterizing a feature of the sample based on the output signal or image.

    摘要翻译: 一种设备包括:(i)用于提供可选范围从深紫外波长到红外波长的多个波长的照明光束的明亮光源,(ii)照明光学器件,用于将照明光束以可选择的角度集合朝向样品 (AOI)或方位角(AZ)以及偏振态来提供光谱椭圆偏振法,其中所述照明光学器件包括用于在所述可选AOI / AZ集合中的每一个处控制所述样本上的所述照明光束的光斑尺寸的变迹器,(iii )收集光学器件,用于响应于在每个可选择的AOI / AZ集合处的照明光束和来自基于输出光束生成输出信号或图像的检测器的偏振状态的来自样本的输出光束,以及(v) 控制器,用于基于输出信号或图像来表征样本的特征。