摘要:
Compounds of formula (I): M(R 1 CS 2 )R 2 R 3 R 4 R 5
R 1 , R 2 , R 3 , R 4 , R 5 are organic ligands being independently selected in H, C1-C4 alkyl group linear or branched, aryl group, silyl group, alkylamine group, alkylsylilamine group. M is niobium.
摘要翻译:式(I)的化合物:M(R 1 CS 2)R 2 R 3 R 4 R 5 R 1,R 2,R 3,R 4,R 5是有机配体H中被独立地选择,C1-C4烷基 直链或支链的,芳基,甲硅烷基,烷基,alkylsylilamine基。 M是铌。
摘要:
Compounds of formula (I) : M(R 1 CS 2 )R 2 R 3 NR 6
R 1 , R 2 , R 3 are organic ligands being independently selected in H, C1-C4 alkyl group linear or branched, aryl group, silyl group, alkylamine group, alkylsylilamine group. R 6 is an organic ligand being independently selected in H, C1-C4 alkyl group linear or branched, aryl group, silyl group, alkylsylilamine group. M is Vanadium.
摘要翻译:式(I)的化合物:M(R 1 CS 2)R 2 R 3 NR 6 R 1,R 2,R 3是有机配体正在H,C1-C4烷基线性独立选择的或支链的,芳基,甲硅烷基 基,烷基胺基团,alkylsylilamine基。 R 6为在H,C1-C4烷基直链被独立选择的或支链的有机配体,芳基,甲硅烷基,alkylsylilamine基。 M是钒。
摘要:
A method for forming a vanadium-containing layer on a substrate, the method comprising at least the steps of: a) providing a vapor comprising at least one precursor compound according to the invention; b) reacting the vapor comprising the at least one compound according to the invention with the substrate, according to an atomic layer deposition process, to form a layer of a vanadium-containing complex on at least one surface of said substrate.
摘要:
Compounds of the general formula (I): [(R 1 R 2 R 3 R 4 R 5 )C 5 )] 2 M(A) x - M is barium; - R1, R2, R3, R4, R5 are an organic ligand independently selected in the group consisting of H, C1-C5 linear or branched alkyl; - A is selected in the group consisting of alcohol, alkylamine, ether (acyclic, cyclic and poly-acyclic); - 0 ≤ X ≤ 4;
摘要翻译:通式(I)的化合物:[(R 1 R 2 R 3 R 4 R 5)C 5)] 2 M(A)x-M为钡; -R 1,R 2,R 3,R 4,R 5是独立地选自H,C 1 -C 5直链或支链烷基的有机配体; A选自醇,烷基胺,醚(无环,环和多环); - 0‰¤X‰¤4;
摘要:
Compounds of formula (I): M(R 1 CS 2 )R 2 R 3 NR 6
R 1 , R 2 , R 3 are organic ligands being independently selected in H, C1-C4 alkyl group linear or branched, aryl group, silyl group, alkylamine group, alkylsylilamine group. R 6 is an organic ligand being independently selected in H, C1-C4 alkyl group linear or branched, aryl group, silyl group, alkylsylilamine group. M is niobium.
摘要翻译:式(I)的化合物:M(R 1 CS 2)R 2 R 3 NR 6 R 1,R 2,R 3是有机配体正在H,C1-C4烷基线性独立选择的或支链的,芳基,甲硅烷基 基,烷基胺基团,alkylsylilamine基。 R 6为在H,C1-C4烷基直链被独立选择的或支链的有机配体,芳基,甲硅烷基,alkylsylilamine基。 M是铌。
摘要:
Compound of formula (I): [(R1R2R3R4R5R6)Salen)]M(A)x - M is barium; - R1, R2, R3, R4, R5, R6 are an organic ligands independently selected in the group consisting of H, C1-C5 linear or branched alkyl; - A is selected in the group consisting of alcohol, alkylamine, ether; - 0 ≤ x ≤ 3
摘要翻译:式(I)化合物:[(R 1 R 2 R 3 R 4 R 5 R 6)Salen)] M(A)x-M为钡; -R 1,R 2,R 3,R 4,R 5,R 6是独立地选自H,C 1 -C 5直链或支链烷基的有机配体; A选自醇,烷基胺,醚; - 0‰¤x‰¤3
摘要:
A method for forming an indium containing thin film on a substrate comprising at least the steps of: a) providing a vapor comprising at least one precursor compound of the formula (I): [(R a )(R b )ln(NR c R d )] 2 , wherein: - Ra and Rb are independently selected in the group consisting of H, C1-C6 linear or branched alkyl, aryl or alkylsilyl; - Rc and Rd are independently selected in the group consisting of C1-C4 linear or branched alkyl, aryl or alkylsilyl;
b)reacting the vapor comprising the at least one compound of formula (I) with the substrate, according to an atomic layer deposition process, to form a layer of an indium-containing complex on at least one surface of said substrate.
摘要翻译:一种在衬底上形成含铟薄膜的方法,至少包括以下步骤:a)提供包含至少一种式(I)的前体化合物的蒸气:[(R a)(R b)ln(NR c R d)] 2,其中:-R a和R b独立地选自H,C 1 -C 6直链或支链烷基,芳基或烷基甲硅烷基; R c和R d独立地选自C 1 -C 4直链或支链烷基,芳基或烷基甲硅烷基; b)根据原子层沉积方法使包含至少一种式(I)化合物的蒸气与基材反应,以在所述基材的至少一个表面上形成含铟复合物层。
摘要:
A method of forming an Al 2 O 3 /SiO 2 stack comprising successively the steps of: a) providing a substrate into a reaction chamber; b) injecting into the reaction chamber, through an ALD process, at least one silicon containing compound selected from the group consisting of:
c) injecting into the reaction chamber an oxygen source selected in the list: oxygen, ozone, oxygen plasma, water, CO 2 plasma, N 2 O plasma; d) reacting at a temperature comprised between 20°C and 400°C, preferably lower or equal to 250°C, into the reaction chamber at least one of the silicon containing compounds and the oxygen source in order to obtain the SiO 2 layer deposited onto the substrate; e) injecting on said silicon oxide film, through an ALD process, at least one aluminum containing compound selected in the list: Al(Me) 3 , Al(Et) 3 , Al(Me) 2 (OiPr), Al(Me) 2 (NMe) 2 or Al(Me) 2 (NEt) 2 ; f) injecting the oxygen source as defined in step c); g) reacting at a temperature comprised between 20°C and 400°C, preferably lower or equal to 250°C, into the reaction chamber at least one of the aluminium containing compounds and the oxygen source in order to obtain the Al 2 O 3 layer deposited onto the SiO 2 layer issued of step d).