摘要:
A detector apparatus is described for scanning of and obtaining radiation data from an object and generating an image therefrom. The apparatus comprises a radiation detector system spaced therefrom to define a scanning zone and to collect a dataset of information about radiation incident at the detector after interaction with an object and to resolve collected information spatially in two dimensions across a scan area and spectroscopically across a plurality of frequency bands in the spectrum of the source. A detector exhibits a spectroscopically variable response across at least a part of the spectrum of the source and to resolve collected information spatially with a rastering module configured to divide the scanning area into a plurality of pixels two dimensions; and a control to move the detector to scan such pixels successively and thereby collect a dataset for each pixel. A method is also described.
摘要:
A method of and device for processing a radiation pulse are described based on: detecting an event at the detector; producing a pulse; determining for the pulse: a pulse height measurement representative of pulse magnitude; a pulse width measurement representative of pulse duration; assigning the pulse to one of at least two classes based on the determined pulse height/pulse width; applying to each pulse an algorithm specific to its particular class to produce an output pulse height/pulse width profile.
摘要:
A method of radiological examination of an object for the identification and detection of the composition the object comprising the steps of: irradiating an object under test with high energy radiation such as x-rays or gamma-rays and collecting radiation emergent from the object at a suitable detector system in such manner that emergent radiation intensity data is collected for the entire volume of the object under test; numerically processing the radiation intensity data to obtain a first data item correlated to the total number of electrons within the sample; applying an alternative method to obtain a second data item correlated to another property of the sample; using the first and second data items to derive an indication of the material content of the sample.
摘要:
A semiconductor detector device comprising: a detector element comprising at least one active detector layer of piezoelectric semiconductor material; a stress inducing element arranged to act in use on the detector element to generate therein a predetermined pattern of stress, and consequently a predetermined electrical field via the piezoelectric effect. A method of fabrication and of operation of a semiconductor detector device embodying these principles are also described.
摘要:
A method for monitoring objects for example for facilitating the identification and/or authentication of objects comprises: in a first recording phase: irradiating an object with a suitable source of radiation, collecting intensity information about radiation emergent from the object, resolving the intensity information spectroscopically between at least two energy bands, and storing the resultant dataset as a reference dataset;and in a second verification phase: irradiating an object with a suitable source of radiation, collecting intensity information about radiation emergent from the object, resolving the intensity information spectroscopically between at least two energy bands, and using the resultant dataset as a test dataset; identifying the object and retrieving its corresponding reference dataset; comparing the test dataset and the reference dataset within predetermined tolerance limits, and: in the event that the reference dataset and the test dataset correspond within the predetermined tolerance limits, treating the object as verified or in the event that the reference dataset and the test dataset differ by more than the predetermined tolerance limits, in a third identification phase: numerically processing the resolved intensity information from the test dataset to derive therefrom a dataset of information characteristic of the composition of the object, and using this information to identify the composition of the object.
摘要:
A method of bonding a semiconductor structure to a substrate to effect both a mechanical bond and a selectively patterned conductive bond, comprising the steps of mechanically bonding a semiconductor structure to a substrate by means of a bonding layer; providing gaps in the bonding layer generally corresponding to a desired conductive bond pattern; providing vias though the substrate generally positioned at the gaps in the bonding layer; causing electrically conductive material to contact the semiconductor structure exposed through the vias. A device made in accordance with the method is also described.