Abstract:
An elastic member according to the present invention is an elastic member formed of a wire having a cross section that is substantially circular, the cross section being orthogonal to a longitudinal direction, and the elastic member being expandable and contractible in a predetermined direction; and including: a first alloy portion that is made of an aluminum alloy having a tensile strength larger than 950 MPa and equal to or less than 1100 MPa at room temperature; and a second alloy portion configured to cover the first alloy portion, the second alloy portion having a thickness in a radial direction smaller than a radius of the first alloy portion, and being made of an aluminum alloy having a tensile strength of 100 MPa to 650 MPa at room temperature.
Abstract:
An electrical contact member and a contact probe that are durable and economical are provided. For this purpose, an outer peripheral portion, which has a symmetrical shape with respect to a central axis in a longitudinal direction and has a hollow portion, and a core portion, which has an approximate bar shape extending in the longitudinal direction and filling the hollow portion, are included. One of the outer peripheral portion and the core portion is made of a noble metal alloy, and the other is made of a conductive material other than the noble metal alloy. The one of the outer peripheral portion and the core portion, which is made of the noble metal alloy, projects further than the other at one end portion in the longitudinal direction.
Abstract:
In a conductive contact member typically used in fixtures for testing semiconductor devices and circuit boards having solder balls or terminals having solder deposited thereon, and electric sockets for semiconductor devices, a layer of highly electrically conductive material resistant to solder deposition is formed at least over a conductive contact part of the conductive contact member so that transfer of solder of the object to be tested onto the conductive contact member can be reduced and the number of possible contacts that can be effected before the cleaning of the solder deposition on the contact part becomes necessary can be increased. Therefore, the run time of the test line can be increased, and the maintenance cost can be reduced.
Abstract:
To prevent reduction in current-carrying capacity due to a reduced diameter of a probe, a probe unit includes the followings: a plurality of large diameter probes; a plurality of small diameter probes having diameters smaller than those of the large diameter probes; a large-diameter probe holder that includes a plurality of large hole portions which individually hold the large diameter probes, and a plurality of reception hole portions which have diameters smaller than those of the large hole portions, communicate with any one of the large hole portions, and receive end portions of the small diameter probes so that the end portions come into contact with the large diameter probes, while a set of the large hole portion and the reception hole portion that communicate with each other pierces through the large-diameter probe holder in a thickness direction; and a small-diameter probe holder that includes a plurality of small hole portions which individually hold the small diameter probes while preventing the small diameter probes from coming off and which pierce through the small-diameter probe holder, and that is stacked on the large-diameter probe holder so that each small hole portion communicates with any one of the reception hole portions. The central axes in a longitudinal direction of the large hole portion and the small hole portion that communicate with each other are separated from each other, and the small hole portions include two small hole portions which are adjacent to each other and of which central axes are separated from each other by a distance shorter than a distance between the central axes of two large hole portions that are corresponding to the two small hole portions.
Abstract:
A contact probe according to the present invention is a needle-shape conductive connection terminal that is extensible and compressible in a longitudinal direction, and includes: a first plunger including a first tip portion configured to contact with an electrode of a contact target, and a first base end portion that extends from the first tip portion; a second plunger including a second tip portion configured to contact with an electrode of a contact target, and a second base end portion that extends from the second tip portion, wherein a line passing through a central axis of the second base end portion intersects with a line passing through a central axis of the second tip portion, the second base end portion having elasticity and configured to contact with the first base end portion; and a coil spring that is made from a winding of a wire, through which the first base end portion and the second base end portion are inserted, couples the first tip portion and the second tip portion such that the central axes of the first tip portion and the second tip portion become substantially in parallel, and is extensible and compressible in the longitudinal direction.
Abstract:
Equipped are a conductive first plunger (21) including, on a same axis, a distal end portion (21a) having a tapered distal end shape, a flange portion (21c) extending from a base end side of the distal end portion (21a) and having a diameter larger than a diameter of the distal end portion (21a), a boss portion (21d) having a diameter smaller than a diameter of the flange portion (21c), and a base end portion (21e) having a diameter smaller than a diameter of the boss portion (21d), a conductive second plunger (22) including, on the same axis, a second distal end portion having a tapered distal end shape and a boss portion (22c) having a diameter substantially equal to a diameter of the base end portion (21e), and a coil spring (23) including a coarsely wound portion (23a) formed by winding at a predetermined pitch with an inner diameter equal to or larger than the diameter of the boss portion (21d) and a tightly wound portion (23b) formed by tightly winding with an inner diameter substantially equal to the diameter of the boss portion (22c), so that the first plunger (21) and the second plunger (22) are connected to each other on the same axis.
Abstract:
Provided herein are a spring wire rod that can ensure conductivity capable of dealing with a high-frequency signal having a frequency of equal to or higher than 1 GHz while ensuring a spring characteristic, a contact probe using the spring wire rod, and a probe unit using the contact probe. The spring wire rod includes a wire core that is made of a conductive material having an electrical resistivity of equal to or slower than 5.00 × 10 -8 Ω•m, and a coating member 3 that is made of a spring material having a longitudinal elastic modulus of equal to or higher than 1.00 × 10 4 kgf/mm 2 and coats an outer circumference of the core. A coating thickness d of the coating member is smaller than a minimum value r of a distance between the center of gravity of a transverse cross section of the core and the outer edge of the transverse cross section.
Abstract:
A lathe machining member is provided that, when a rare and expensive material is used as a raw material for forming a machined product, is capable of reducing waste of such material and reducing costs. For this purpose, a cylindrical core portion (3), at least a part of which is made of a noble metal alloy and which has a diameter larger than a maximum diameter of a shape obtained by lathe machining, and a hollow-cylindrical peripheral portion (2), which is made of a material different from the material of the core portion (3), are included. The core portion (3) is arranged in a hollow portion of the peripheral portion (2) with no space. The material applied to the peripheral portion (2) is a free-cutting material selected from a group of, for example, free-cutting brass, free-cutting phosphor bronze, free cutting nickel silver, and free-cutting beryllium copper. The noble metal alloy applied to the core portion (3) is, for example, alloy mainly consisting of silver (Ag), palladium (Pd), gold (Au), platinum (Pt), zinc (Zn), copper (Cu), iron (Fe), and nickel (Ni), alloy mainly consisting of palladium, silver, and copper, or alloy mainly consisting of silver, platinum, zinc, gold, and copper.