利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

534 条记录 (耗时 0.015 秒)

    PHYSICAL QUANTITY MEASURING DEVICE AND MANUFACTURING METHOD OF PHYSICAL QUANTITY MEASURING DEVICE
    18.
    发明公开
    PHYSICAL QUANTITY MEASURING DEVICE AND MANUFACTURING METHOD OF PHYSICAL QUANTITY MEASURING DEVICE 审中-公开

    公开(公告)号：EP3715814A1

    公开(公告)日：2020-09-30

    申请号：EP20164917.5

    申请日：2020-03-23

    申请人： NAGANO KEIKI CO., LTD.

    发明人： ABE, Yusuke ,  TOHYAMA, Shuji ,  SEKIYA, Haruhiko

    IPC分类号： G01L19/14 ,  G01L19/00 ,  G01L19/04

    摘要： A physical quantity measuring device (1) includes: a metallic cylindrical case (2); a sensor module (4) configured to detect a physical quantity; a synthetic-resin joint (3) provided near a first open end (24) of the cylindrical case (2), the joint (3) being attached with the sensor module (4) and provided with an introduction port (311) for introducing a measurement target fluid; and a cover (5) provided near a second open end (25) of the cylindrical case (2). The cover (5) includes a locking portion (523) for locking the sensor module (4). The cylindrical case (2) includes an engagement portion (22) provided near the first open end (24) and engaged with the joint (3) and a crimp portion (23) provided near the second open end (25), the crimp portion (23) configured to be plastically deformed by crimping. The cover (5) is attached to the cylindrical case (2) by crimping the crimp portion (23).