利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

54 条记录 (耗时 0.014 秒)

    X-RAY DIFFRACTION-BASED DEFECTIVE PIXEL CORRECTION METHOD USING AN ACTIVE PIXEL ARRAY SENSOR
    22.
    发明公开
    X-RAY DIFFRACTION-BASED DEFECTIVE PIXEL CORRECTION METHOD USING AN ACTIVE PIXEL ARRAY SENSOR 审中-公开
    X射线-DIFFRAKTIONSBASIERTES法修正缺陷像素与有源像素传感器装置

    公开(公告)号：EP3019857A1

    公开(公告)日：2016-05-18

    申请号：EP14747447.2

    申请日：2014-07-08

    申请人： Bruker AXS, Inc.

    发明人： KAERCHER, Joerg ,  CHAMBERS, John L.

    IPC分类号： G01N23/207

    CPC分类号： G01T7/005 ,  G01N23/207

    摘要： A method for correcting erroneous intensity measurements caused by defective pixels of the detector for a single-crystal X-ray diffraction system uses collected diffraction images and a defective pixel list to modify three-dimensional reflection profiles by replacing profile elements affected by defective pixels with corresponding profile elements from a model profile. Reflection positions on the detector are predicted using a crystal orientation matrix and a three-dimensional observed profile is constructed for each reflection. A model profile is constructed using normalized data from multiple reflection profiles. The observed profiles are compared with the defective pixel list to determine which profile elements are affected by defective pixels, and those elements are replaced by corresponding elements from the model profile. If the replaced elements represent more than a predetermined percentage of the overall reflection intensity, the data for that reflection is omitted from an overall dataset for the crystal.

    METHOD AND APPARATUS FOR SURFACE MAPPING USING IN-PLANE GRAZING INCIDENCE DIFFRACTION
    23.
    发明公开
    METHOD AND APPARATUS FOR SURFACE MAPPING USING IN-PLANE GRAZING INCIDENCE DIFFRACTION 审中-公开
    方法和装置具有掠入射衍射平面映射

    公开(公告)号：EP2941635A1

    公开(公告)日：2015-11-11

    申请号：EP14703642.0

    申请日：2014-01-07

    申请人： Bruker AXS, Inc.

    发明人： GIENCKE, Jonathan

    IPC分类号： G01N23/201

    CPC分类号： G01N23/207 ,  G01N23/201 ,  G01N2223/501 ,  G01N2223/61 ,  G01N2223/6116

    摘要： An apparatus for examining the surface of a crystalline sample uses in-plane grazing incidence diffraction with a position-sensitive detector. The x-ray source illuminates an extended region of the sample and, for crystal sections having the appropriate lattice orientation, an elongated diffraction signal is produced. The relative position of the sample and the x-ray beam may then be changed to illuminate different regions of the sample so that the diffraction signal corresponds to these other regions. By scanning across the entire sample, a spatial profile of the sample surface may be generated. The system may be used to locate crystal boundaries, defects, or the presence of attenuating materials on the sample surface.

    METHOD AND APPARATUS FOR USING AN AREA X-RAY DETECTOR AS A POINT DETECTOR IN AN X-RAY DIFFRACTOMETER
    24.
    发明公开
    METHOD AND APPARATUS FOR USING AN AREA X-RAY DETECTOR AS A POINT DETECTOR IN AN X-RAY DIFFRACTOMETER 有权
    方法和装置采用面积X射线探测器作为一个点的探测器X射线衍射仪

    公开(公告)号：EP2564186A2

    公开(公告)日：2013-03-06

    申请号：EP11777783.9

    申请日：2011-04-07

    申请人： Bruker AXS, Inc.

    发明人： HE, Bob

    IPC分类号： G01N23/207 ,  G01B15/00

    CPC分类号： G01N23/207

    摘要： An area detector used in a two-dimensional system is used as a point detector in Bragg-Brentano and other geometries by providing the area detector with a mask the limits the area through which X-rays can enter the detector. Secondary X-ray optics and a monochromator that are part of the diffractometer geometry are attached to the area detector mask to allow a fast and easy switch between the two-dimensional detector mode and the point detector mode. A concave detector mask is used with a spherical detector in order to reduce the secondary beam path and increase detector efficiency and the opening in the detector mask can be offset from the mask center to achieve high 2θ angle measurements. Single channel bypath electronics are used to disregard the dimensional position of each X-ray count to increase the efficiency and speed of the system.

    摘要翻译： 在二维系统中使用区域检测器是通过提供与检测器的区域掩模的限制，通过该X射线可以进入检测器的区域用作在布拉格布伦塔诺和其它几何形状的点检测器。 次级X射线光学器件和一个单色确实被衍射仪几何图形的一部分附连到区域检测器掩模以允许二维检测器模式和点检测器模式之间的便捷开关。 有凹探测器掩模，以便降低次级光束路径，并增加检测器的效率和在探测器掩模中的开口用来与球形探测器可以从掩模中心偏移，以实现高的2θ角的测量。 旁路电子单信道被用来忽略各X射线计数的三维位置，以提高系统的效率和速度。

    Transmission mode X-ray diffraction screening system
    25.
    发明授权
    Transmission mode X-ray diffraction screening system 有权
    通过在透射几何一X射线衍射仪的手段筛选

    公开(公告)号：EP1490671B1

    公开(公告)日：2012-05-09

    申请号：EP03718009.8

    申请日：2003-03-20

    申请人： Bruker AXS, Inc.

    发明人： HE, Bob, Baoping ,  BOLLIG, Ryan, C. ,  BRÜGEMANN, Hans, Mathias, Lutz

    IPC分类号： G01N23/20

    CPC分类号： G01N23/20016 ,  G01N23/20

    摘要： A transmission mode x-ray diffraction screening system has a sample support that holds a sample tray with multiple samples to be tested. The sample support is connected to a translation stage that is movable in three dimensions, and that it offset from the location of the sample support. An x-ray source is located to one side of the sample support, and a detector is located to the other side, thereby allowing the detection of x-rays that are diffracted by the sample in a transmission mode. A retractable beamstop may be located between the sample and the detector to block at least part of the non-diffracted x-rays from the source. A video camera may also be provided for imaging the sample location, which may be illuminated by a laser. The entire system may be automated such that each sample in the sample tray may be sequentially analyzed.

    Beam scattering measurement system with transmitted beam energy detection
    28.
    发明公开
    Beam scattering measurement system with transmitted beam energy detection 有权
    射线散射测定装置的检测的连续束能量的

    公开(公告)号：EP1024356A3

    公开(公告)日：2002-12-18

    申请号：EP99124429.4

    申请日：1999-12-08

    申请人： Bruker AXS, Inc.

    发明人： He, Bob Baoping ,  Smith, Kingsley L.

    IPC分类号： G01N23/20

    CPC分类号： G01N23/20

    摘要： A radiation scattering measurement system, such as an x-ray diffraction system, uses a modified beamstop, or attenuator, to allow simultaneous detection of energy scattered from a sample and energy transmitted through the sample. Rather than entirely blocking the transmitted beam energy from reaching a detector of the system, the attenuator blocks only an outer portion of the transmitted beam, so that a shadow region is created on the detector surrounding the detector region upon which the transmitted beam is incident. This local region of minimum intensity defines a boundary on the detector between the transmitted beam energy and the energy scattered from the sample. The attenuator also reduces the per-unit-area intensity of the transmitted beam using a broadband filter element, so that the transmitted beam does not saturate the detector. A single detector frame is taken containing the beam energy and the scattered energy, and the minimum intensity boundary between the two is located. The measurements from the different detector regions are then used to determine the relative intensity between the transmitted beam and the scattered energy, and a transmission coefficient is calculated.