Abstract:
Apparatus and associated methods relate to determining the wavelength of a narrow-band light beam. The narrow-band light beam is passed through an optical filter (40). The optical filter has complementary and monotonically-varying transmission and reflection coefficients within a predetermined band of wavelengths. The predetermined band of wavelengths includes the wavelength of the narrow-band light beam. A first photodetector (42T) detects amplitude of a first portion of the narrow-band light beam transmitted by the optical filter. A second photodetector (42R) detects amplitude of a second portion of the narrow-band light beam reflected by the optical filter. The wavelength of the narrow-band light beam is determined, based on a ratio of the determined amplitudes of the first and second portions of the narrow-band light beam transmitted and reflected, respectively.
Abstract:
An opto-electronic device (100) for processing optical and electric pulses includes a photoconductor device (10) with a sensor section (11) which is made of a band gap material and which has electrical sensor contacts (12, 13), and a signal processing device (20) which is connected with the sensor contacts (12, 13), wherein the photoconductor device (10) is adapted to create a photocurrent between the sensor contacts (12, 13) in response to an irradiation with ultra-short driving laser pulses (1) having a photon energy smaller than the energy band gap of the band gap material, having a non-zero electric field component (3) oriented parallel with a line (4) between the electrical sensor contacts (12, 13), and causing a charge carrier displacement in the band gap material, and wherein the signal processing device (20) is configured for an output of an electric signal being characteristic for at least one of carrier-envelope phase (CE phase), intensity, temporal properties, spectral intensity and spectral phase of the driving laser pulses (1). Furthermore, a laser source device including the opto-electronic device and pulse processing method for processing optical and electric pulses are described.
Abstract:
A method of determining a temporal waveform of a pulse, the method comprising: obtaining a symmetric composite function comprising the temporal waveform of the pulse and a reference function; obtaining a measured Fourier transform of the symmetric composite function; and calculating an inverse Fourier transform of the measured Fourier transform of the symmetric composite function, wherein the calculated inverse Fourier transform provides information regarding the temporal waveform.
Abstract:
A laser pulse detector device (100), being configured for determining a temporal relationship of first and second laser pulses (A, B), comprises a beam combiner device (10) for overlapping the first and second laser pulses on a common beam path (1), a non-linear crystal device (20) for creating a first signal pulse (C) and a second signal pulse (D) by optically non-linear interactions of the first and second laser pulses (A, B), wherein an intensity difference of the first and second signal pulses (C, D) depends on the temporal relationship of the first and second laser pulses, and a sensor device (30) including two sensor units (31, 32) each for detecting one of the first and second signal pulses (C, D) and being adapted for providing a sensor signal output determined by the intensity difference of the first and second signal pulses (C, D), wherein the non-linear crystal device (20) is configured for creating the first and second signal pulses (C, D) along the common beam path (1), the first and second signal pulses (C, D) have different spectral properties, and a spectrally selective beam separator device (40) is arranged between the non-linear crystal device (20) and the two sensor units (31, 32) of the sensor device (30) for spectrally separating the first and second signal pulses (C, D). Furthermore, a laser apparatus (200) including the laser pulse detection device and a laser pulse detection method are described.
Abstract:
Embodiments of the present invention generally describe systems, devices, and methods for directly measuring pulse profiles during pulse delivery. In some embodiment, the pulse profiles may be measured while the pulse is delivered to ablate a material. Embodiments, may calculate ablation spot parameters based on the pulse profiles and may refine one or more subsequent laser pulses based on deviations from the calculated ablation spot parameters from desired ablation spot parameters. In some embodiments, a fluence profiler is provided. The fluence profiler may measure a pulse profile of a laser pulse from a portion of the laser pulse. The fluence profiler may utilize a UV radiation energy sensor device and a camera-based imager. The measurements from the UV radiation energy sensor device and the camera-based imager may be combined and scaled to provide a measured pulse profile that corresponds to the delivered pulse.