Abstract:
Portable analytical equipment, systems, methods, and techniques related thereto is disclosed. Portable analytical equipment can comprise a controller and a probe. The probe can interrogate a sample and receive a response to the interrogation. The controller can select and/or initiate an analysis related to interrogating the sample via the probe. The analysis can be selected from a portfolio of analyses stored on the controller. The controller can analyze the response to the interrogation based on reference data stored on the controller. The controller can determine an indication based on the analyzing the response for presentation via a low-power interface, which can comprise an LED or electrophoretic element. The controller can further be connected to an external device, e.g., a smartphone or remote PC, to present collected data and the analyzing of the response to the interrogation. The disclosed subject matter can be employed in hand-held analytical equipment, e.g., a hand-held Raman spectrometer.
Abstract:
A computer-implemented intelligent alignment method for a color sensing device (12) which initially obtains a raw sense value measured by the color sensing device and converts the raw sense value to a tristimulus value (S401). The color sensing device may be calibrated using a known set of colors (S402). Raw readings received from the color sensing device may be mapped to known tristimulus values (S403), and mapped values may be converted to a standard reference illuminant color space (S404). A client-server system may be provided in which a color sensing device and one or more servers collectively execute operations according to the present disclosure.
Abstract:
A spectrometer (100) for characterizing a radiation beam, the spectrometer (100) comprising an optical radiation guiding system comprising a collimator (110) for collimating the radiation beam into a collimated radiation beam, and a beam shaper (120) for distributing the power of the collimated radiation beam over a discrete number of line shaped fields, and a spectrometer chip (130) wherein the spectrometer chip (130) is adapted for processing the radiation in a discrete number of line shaped fields coming from the beam shaper (120).
Abstract:
Die Erfindung betrifft ein Verfahren zur Ermittlung zumindest einer Prüfeigenschaft eines Prüfgegenstands und eine Messvorrichtung, welche geeignet ist, ein Messfeld (3) unter einer Vielzahl an Anstrahlungskombinationen aus Einstrahlungswinkel (α) und/oder Wellenlängenbereich (A) mit elektromagnetischer Strahlung (5) anzustrahlen und die Intensität der jeweils von dem Messfeld unter zumindest einem Abstrahlungswinkel (β) remittierten elektromagnetischen Strahlung (5) zu messen. Die Prüfeigenschaft weist zumindest ein definiertes messbares Einzelmerkmal auf, wobei das Einzelmerkmal oder eine definierte Merkmalskombination mehrerer solcher Einzelmerkmale die Herkunft und/oder Identität des Prüfgegenstandes (1) belegt, wobei das Einzelmerkmal oder die Merkmalskombination messbar ist, wenn sie durch die elektromagnetische Strahlung (5) auf eine durch eine Auswahl an Anstrahlungkombinationen definierte Art und Weise optisch angeregt wird. Das Einzelmerkmal oder die Merkmalskombination wird mit der Messvorrichtung (4) in dieser Art und Weise angeregt und gemessen.
Abstract:
A spectrophotometer optics system is provided. The spectrophotometer optics system includes an optical sensing array and an optical waveguide including an input side and an output side. The input side of the optical waveguide receives input light and the optical sensing array is located at the output side of optical waveguide. The optical waveguide is configured to carry light to be analyzed by total internal reflection to the output side of the optical waveguide and to direct the light to be analyzed toward the optical sensing array. The spectrophotometer optics system includes an optical dispersive element configured to separate the light to be analyzed into separate wavelength components, and the optical dispersive element is supported by the optical waveguide.
Abstract:
A system for monitoring and controlling a batch process. The system includes a control system that is operable to control the batch process and to receive measured process variables of the batch process. An analyzer analyzes a material sample from the batch process and generates array data representative of the composition of the material sample. An analyzer controller is operable to collect the array data from the analyzer and the measured process variables from the control system. A software data server running on a computer is operable to retrieve the array data and the measured process variables from the analyzer controller. A software information management system running on the computer is operable to receive the measured process variables and the array data from the data server and to store the measured process variables and the array data in a database in an associated manner.
Abstract:
Disclosed are a mobile and expandable firmware-based optical spectroscopy system and a method for controlling same. The optical spectroscopy system may comprise: a wearing part attached to a particular region of a subject to irradiate light, on the basis of a firmware, to the particular region and measure the bodily signals of the subject by collecting emergent light which has passed through the particular region; and a monitoring unit, connected to the wearing part via a wired or wireless network, for controlling the strength of the light irradiated from the wearing part.
Abstract:
A system and method of optical spectrum analysis that circumvents the trade-off between resolution and sensitivity by combining two spectral measurements: a first spectrum (102) from first spectral measurement means (240), having high resolution and low sensitivity; and a second spectrum (103) from second spectral measurement means (220), having lower resolution but higher resolution. The input of the of the first spectral measurement means (240) is amplified by an optical amplifier (230), being the effects induced by said amplifier (230) on the first spectrum (102) corrected at processing means (270) by comparison with the second spectrum (103).