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公开(公告)号:EP4272317A1
公开(公告)日:2023-11-08
申请号:EP21848089.5
申请日:2021-12-28
发明人: WEN, Bing , HONG, John , CHAN, Edward
IPC分类号: H03M3/00
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公开(公告)号:EP4403892A2
公开(公告)日:2024-07-24
申请号:EP24179836.2
申请日:2019-04-17
发明人: CHAN, Edward , WEN, Bing , HONG, John , CHANG, Tallis , RYU, Seung-Tak
IPC分类号: G01J5/24
摘要: Methods of sensor readout and calibration and circuits for performing the methods are disclosed. In some embodiments, the methods include driving an active sensor at a voltage. In some embodiments, the methods include use of a calibration sensor, and the circuits include the calibration sensor. In some embodiments, the methods include use of a calibration current source and circuits include the calibration current source. In some embodiments, a sensor circuit includes a Sigma-Delta ADC. In some embodiments, a column of sensors is readout using first and second readout circuits during a same row time.
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公开(公告)号:EP4107117A1
公开(公告)日:2022-12-28
申请号:EP21712606.9
申请日:2021-02-19
发明人: HONG, John , CHANG, Tallis , ANDREWS, Sean , BOS, Jan , MA, Jia-Wei
IPC分类号: B81B7/00
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公开(公告)号:EP4240691A1
公开(公告)日:2023-09-13
申请号:EP21836724.1
申请日:2021-12-09
发明人: CHANG, Tallis , ANDREWS, Sean
IPC分类号: B81C1/00
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公开(公告)号:EP4399559A2
公开(公告)日:2024-07-17
申请号:EP22868007.0
申请日:2022-09-07
发明人: SHIN, Heesun , WEN, Bing , CHAN, Edward , ANDREWS, Sean , CHANG, Tallis , HONG, John
IPC分类号: G02B26/08 , H01L27/146 , B61B7/02
CPC分类号: H04N25/21
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公开(公告)号:EP4403892A3
公开(公告)日:2024-10-02
申请号:EP24179836.2
申请日:2019-04-17
发明人: CHAN, Edward , WEN, Bing , HONG, John , CHANG, Tallis , RYU, Seung-Tak
IPC分类号: H04N5/33 , G01J5/20 , G01J5/24 , G01J1/46 , G01J5/02 , G01J5/80 , H04N23/23 , H04N25/76 , G01J1/42
摘要: Methods of sensor readout and calibration and circuits for performing the methods are disclosed. In some embodiments, the methods include driving an active sensor at a voltage. In some embodiments, the methods include use of a calibration sensor, and the circuits include the calibration sensor. In some embodiments, the methods include use of a calibration current source and circuits include the calibration current source. In some embodiments, a sensor circuit includes a Sigma-Delta ADC. In some embodiments, a column of sensors is readout using first and second readout circuits during a same row time.
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公开(公告)号:EP3782360A1
公开(公告)日:2021-02-24
申请号:EP19721942.1
申请日:2019-04-17
发明人: CHAN, Edward , WEN, Bing , HONG, John , CHANG, Tallis , RYU, Seung-Tak
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公开(公告)号:EP3765401A1
公开(公告)日:2021-01-20
申请号:EP19714013.0
申请日:2019-03-14
发明人: HONG, John , CHANG, Tallis , CHAN, Edward , WEN, Bing , PAN, Yaoling , ANDREWS, Sean
IPC分类号: B81C1/00
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