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    RADIATION DETECTOR, METHOD OF MANUFACTURING A RADIATION DETECTOR AND USE OF THE DETECTOR FOR MEASURING RADIATION
    1.
    发明公开
    RADIATION DETECTOR, METHOD OF MANUFACTURING A RADIATION DETECTOR AND USE OF THE DETECTOR FOR MEASURING RADIATION 审中-公开
    辐射探测器，制造辐射探测器和使用检测仪辐射测量方法

    公开(公告)号：EP3139409A1

    公开(公告)日：2017-03-08

    申请号：EP16162571.0

    申请日：2008-12-03

    申请人： Rakkatec Oy

    发明人： GARCIA, Francisco ,  ORAVA, Risto ,  LOZANO, Manuel ,  PELLEGRINI, Giulio

    IPC分类号： H01L27/146 ,  H01L27/144 ,  H01L31/0352

    CPC分类号： H01L27/14603 ,  H01L27/1446 ,  H01L27/14634 ,  H01L27/14683 ,  H01L31/035263 ,  H01L31/035281

    摘要： A detector for detecting signals derived from charged particles (1) incident thereon, the charged particles consisting of at least one of protons, deuterons, tritons, and α-particles, and for distinguishing signals caused from the charged particles interacting with the detector from background radiation containing neutron and gamma particles, the detector comprising: a silicon wafer (4) having an entrance opening etched through a low-resistivity layer of silicon; a sensitive layer of high-resistivity silicon (3) for converting the radiation particles into detectable charges; a passivation layer (6) between the low-resistivity layer and the sensitive layer of high-resistivity silicon; a plurality of electrodes (2) built in the form of vertical channels for collecting the charges etched into the sensitive layer of high-resistivity silicon; and read-out electronics for generating signals from the collected charges, wherein the detector is constructed to take in the charged particles to be detected directly through the passivation layer and wherein the thickness of the sensitive layer of high-resistivity silicon has been selected as a function of the mean free path of the charged particles to be detected.

    摘要翻译： 一种用于检测从带电粒子得到的信号检测器在其上的（1）入射时，带电粒子由......组成质子，氘核，氚核中的至少一个，和±α粒子的，和用于区分与来自背景的检测器相互作用的带电粒子引起的信号 含有辐射中子和伽马粒子，所述检测器包括：具有在入口的硅晶片（4）开口通过硅的低电阻率层蚀刻; 高电阻率的硅（3），用于将所述辐射颗粒引入可检测电荷的敏感层; 低电阻率层和高电阻率的硅的敏感层之间的钝化层（6）; 电极的多个（2）内置于用于收集蚀刻到高电阻率的硅的敏感层中的电荷的垂直通道的形式; 和读出电子，用于从收集的电荷产生信号，worin检测器被构造成采取中的带电粒子被穿过钝化层直接检测和worin高阻硅的敏感层的厚度被选择为一个 待检测的带电粒子的平均自由程的功能。

    LOGISTICS SYSTEM AND METHOD FOR MANAGING OBJECTS IN A SPACE
    2.
    发明公开
    LOGISTICS SYSTEM AND METHOD FOR MANAGING OBJECTS IN A SPACE 审中-公开
    用于管理空间中的对象的物流系统和方法

    公开(公告)号：EP3230932A1

    公开(公告)日：2017-10-18

    申请号：EP15868486.0

    申请日：2015-12-14

    申请人： Rakkatec Oy

    发明人： VALTANEN, Jarkko

    IPC分类号： G06Q10/08 ,  B65G65/00 ,  B65G67/02 ,  B65G67/60 ,  B65G57/00 ,  B65G1/137

    CPC分类号： G06Q50/28 ,  B63B25/004 ,  B65G1/137 ,  B65G67/02 ,  B65G67/60 ,  B65G67/603 ,  G06Q10/083

    摘要： A logistics system for managing objects in a space includes at least one boundary area between the space and external surroundings, and transfer devices for handling the objects. The transfer device and/or an object handled thereby has been identified. The system also includes a management unit to identify a mutual order for the objects at a first time instant on the basis of identification and location data regarding the transfer devices and/or the objects, and to determine a desired mutual order for the objects at a second time instant subsequent to the first time instant. In addition, the management unit can commence the actuation of the transfer devices relative to each other prior to the second time instant in such a way that the desired mutual order for the objects will have been achieved at the second time instant.

    摘要翻译： 用于管理空间（102）中的物体的物流系统（100）包括空间与空间的外部环境之间的至少一个边界区域（104），以及多个用于处理物体的传送装置（105） 所述空间（102）。 传送装置（105）和/或由其处理的物体（101）已被识别（107）。 该系统还包括管理单元（103），其适于基于关于传送装置和/或物体的标识和位置数据在第一时刻识别所述空间中的物体的相互顺序 以便在所述第一时刻之后的第二时刻确定对象的期望的相互顺序。 此外，管理单元还适于在所述第二时刻之前开始相对于彼此的所述传送装置的致动，使得在所述第二时刻已经实现所述物体的所述期望的相互顺序。