Semiconductor-on-insulator fabrication method
    3.
    发明公开
    Semiconductor-on-insulator fabrication method 失效
    Verfahren zur Herstellung eines Halbleiters auf einem Isolator。

    公开(公告)号:EP0308588A1

    公开(公告)日:1989-03-29

    申请号:EP88109806.5

    申请日:1985-07-08

    申请人: AT&T Corp.

    IPC分类号: H01L21/20 H01L21/84

    摘要: This method involves the formation of a precursor substrate surface which includes islands (40) of insulating material, each of which is encircled by a crystallization seeding area (170) of substantially single crystal semiconductor material. The boundaries of the islands are defined with a first pattern delineating device, e.g., a mask, which, in terms of the pattern it produces, is substantially identical to a second pattern delineating device. The latter device is a component of pattern delineating apparatus used in forming an IC, e.g., an IC mask set, the component being used to delineate the device regions of the IC. A layer of non-single crystal semiconductor material (45) is formed on the precursor substrate surface (30), and crystallized with little or no displacement of the islands. The pattern delineating apparatus is then used to form an IC in the crystallized material.

    摘要翻译: 该方法包括形成前体衬底表面,其包括绝缘材料的岛状物(40),每个绝缘材料被大致单晶半导体材料的结晶晶种区域(170)包围。 岛的边界由第一图案描绘装置(例如掩模)限定,根据其形成的图案,其基本上与第二图案描绘装置相同。 后一种装置是用于形成IC的图案描绘装置的部件,例如IC掩模组,该部件用于描绘IC的装置区域。 在前体衬底表面(30)上形成一层非单晶半导体材料(45),并且几乎不发生岛的位移而结晶化。 然后使用图案描绘装置在结晶材料中形成IC。