摘要:
A semiconductor package according to an embodiment includes a first insulating layer including a cavity; a connection member buried in the cavity of the first insulating layer; and a molding layer buried in the cavity and surrounding the connection member, wherein a width of the molding layer gradually decreases along a direction from a lower surface of the first insulating layer to an upper surface of the first insulating layer.
摘要:
A circuit board according to an embodiment includes an insulating layer; a first circuit pattern disposed on the insulating layer; a first protective layer disposed on the insulating layer and including an opening that vertically overlaps an upper surface of the first circuit pattern; a first connection part disposed in the opening; and an electrode part disposed on the first connection part, and wherein a width of an upper surface of the electrode part is smaller than a width of the opening of the first protective layer.
摘要:
Provided are an imaging unit, an imaging module, and an endoscope system that make it possible to achieve a reduced diameter of a distal end of an insertion section and to obtain a high-quality image. An imaging unit 10 according to the present invention has a semiconductor package 20 which includes an image sensor and a connection electrode 21 formed on a face f2, a first multi-layer substrate 30 which includes connection electrodes 31, 33 formed on faces f3 and f4 and is connected to the semiconductor package 20 through the connection electrode 31, a second multi-layer substrate 40 which is connected to the first multi-layer substrate 30 with a layer direction of the second multi-layer substrate 40 perpendicular to a layer direction of the first multi-layer substrate 30, an electronic component 51 which is mounted inside the first multi-layer substrate 30, and a cable 60 which is connected to the second multi-layer substrate 40. The second multi-layer substrate 40 is connected to the first multi-layer substrate 30 to form a T shape, and the first multi-layer substrate 30 and the second multi-layer substrate 40 lie within a projected plane in an optical axis direction of the semiconductor package 20.
摘要:
A bridge leg circuit assembly (10, 30) comprising: a circuit board (20, 40), a first active switch die (Q1), and a second active switch die (Q2). The circuit board (20, 40) consists of an insulating plate (14, 34) with a first side and a second side as well as a first conducting layer (11, 31) and a second conducting layer (12, 32) located on the first and second sides of the insulating plate (14, 34), respectively. The second conducting layer (12, 32) consists of a first conducting region (121, 321) and a second conducting region (122, 322) that are insulated from each other. The first active switch die (Q1) consists of an opposing first side and an opposing second side which are embedded into the circuit board (20, 40); the first side of the first active switch die (Q1) is facing and coupled with the first conducting region (121, 321), and the second side of the first active switch die (Q2) is coupled with the second conducting region (122, 322). The second active switch die (Q2) consists of an opposing first side and an opposing second side which are embedded into the circuit board (20, 40); the first side of the second active switch die (Q2) is facing and coupled with the second conducting region (122, 322), and the second side of the second active switch (Q2) is coupled with the first conducting layer (11, 31). Embodiments of the present invention also relate to a full-bridge circuit assembly (50).
摘要:
A semiconductor die, which includes a substrate (12), a group of primary conduction sub-layers (26, 30, 34), and a group of separation sub-layers (28, 32), is disclosed. The group of primary conduction sub-layers is over the substrate. Each adjacent pair of the group of primary conduction sub-layers is separated by at least one of the group of separation sub-layers. As a result, the group of separation sub-layers mitigates grain growth in the group of primary conduction sub-layers.
摘要:
The power module semiconductor device (2) includes: an insulating substrate (10); a first pattern (10a) (D) disposed on the insulating substrate (10); a semiconductor chip (Q) disposed on the first pattern; a power terminal (ST, DT) and a signal terminal (CS, G, SS) electrically connected to the semiconductor chip; and a resin layer (12) configured to cover the semiconductor chip and the insulating substrate. The signal terminal is disposed so as to be extended in a vertical direction with respect to a main surface of the insulating substrate. There is provided a power module semiconductor device having a vertical terminal transfermold in which structure thereof is simple and the number of parts is reduced, thereby achieving space saving.
摘要:
A method (100) of protecting through-substrate via (TSV) die from bonding damage includes providing a substrate including a plurality of TSV die having a topside including active circuitry, a bottomside, and a plurality of TSVs that include an inner metal core that reaches from the topside to protruding TSV tips that extend out from the bottomside (101). A protective layer is formed on or applied to the bottomside of the TSV die including between and over the protruding TSV tips (102). The TSV die is bonded with its topside down onto a workpiece having a workpiece surface and its bottomside up and in contact with a bond head (104). The protective layer reduces damage from the bonding process including warpage of the TSV die by preventing the bond head from making direct contact to the protruding TSV tips.
摘要:
In a method for producing a semiconductor module (10) comprising at least two semiconductor chips (12, 14) and an interposer (20), which has electrically conductive structures (28) that connect the semiconductor chips (12, 14) to each other, the interposer (20) is imprinted directly on a first (12) one of the semiconductor chips. Upon imprinting the interposer (20), the electrically conductive structures (28) are generated by means of electrically conductive ink (68). The second semiconductor chip (14) is installed on the interposer (20) such that the two semiconductor chips (12, 14) are arranged on top of each other and the interposer (20) forms an intermediate layer between the two semiconductor chips (12, 14).
摘要:
There is provided a three-dimensional interconnect structure for microelectronic devices and a method for producing such an interconnect structure. The method comprises a step wherein a backbone structure 100 is manufactured using an additive layer-wise manufacturing process 310. The backbone structure 100 comprises a three-dimensional cladding skeleton 104 and a support structure 101. The cladding skeleton comprises layered freeform skeleton parts 105 that will form the electric interconnections between the electric contacts of the interconnect structure after a conductive material 202 is applied on the backbone structure 100. The support structure 101 supports the layered freeform skeleton parts 105. Parts 306 of the support structure 101 may be removed to isolate and/or expose the electric interconnections 205. The cladding skeleton can be embedded by an insulating material 303 for providing a further support.