COATING FLUID FOR FORMING LOW-PERMITTIVITY SILICA-BASED COATING FILM AND SUBSTRATE WITH LOW-PERMITTIVITY COATING FILM
    4.
    发明公开
    COATING FLUID FOR FORMING LOW-PERMITTIVITY SILICA-BASED COATING FILM AND SUBSTRATE WITH LOW-PERMITTIVITY COATING FILM 有权
    FLÜSSIGEBESCHICHTUNGSZUSAMMENSETZUNG FARR SILICABESCHICHTUNG MIT NIEDRIGERDURCHLÖSSIGKEITUND MIT DIESER ZUSAMMENSETZUNG BESCHICHTETES SUBSTRAT

    公开(公告)号:EP1035183A4

    公开(公告)日:2004-10-20

    申请号:EP99933135

    申请日:1999-07-28

    摘要: A coating fluid capable of forming a silica-based coating film having a relative permittivity as low as 3 or below and a low density and excellent in resistance to oxygen plasma and suitability for other processings; and a substrate having a coating film having such properties. The coating fluid is characterized by comprising a polymer composition comprising (i) an alkoxysilane represented by the following general formula (I) and/or a hydrolyzate of at least one halogenated silane represented by the following general formula (II) and (ii) a readily decomposable resin. In the formulas (I): XnSi(OR)4-n and (II) XnSiX'4-n X represents hydrogen, fluorine, C1-8 alkyl, fluoroalkyl, aryl or vinyl; R represents hydrogen, C1-8 alkyl, aryl, or vinyl; X' represents halogeno; and n is an integer of 0 to 3.

    摘要翻译: 本发明提供一种涂布液,其能够形成相对介电常数低至3以下且密度低且耐氧等离子体性优异且适合其他加工的二氧化硅系涂膜, 以及具有具有这种性质的涂膜的基材。 (i)由下述通式(I)表示的烷氧基硅烷和/或由下述通式(II)表示的至少一种卤代硅烷的水解产物和(ii)由式 易分解的树脂。 在式(I)中:XnSi(OR)4-n和(II)XnSiX'4-n X代表氢,氟,C1-8烷基,氟代烷基,芳基或乙烯基; R代表氢,C 1-8烷基,芳基或乙烯基; X'代表卤代; 并且n是0至3的整数。

    METHOD OF FORMING LOW-DIELECTRIC-CONSTANT FILM, AND SEMICONDUCTOR SUBSTRATE WITH LOW-DIELECTRIC-CONSTANT FILM
    9.
    发明公开
    METHOD OF FORMING LOW-DIELECTRIC-CONSTANT FILM, AND SEMICONDUCTOR SUBSTRATE WITH LOW-DIELECTRIC-CONSTANT FILM 有权
    方法制造具有低介电常数和半导体器件的介电膜SO一部电影

    公开(公告)号:EP1197999A4

    公开(公告)日:2006-04-12

    申请号:EP00981780

    申请日:2000-12-15

    IPC分类号: H01L21/314 H01L21/316

    CPC分类号: H01L21/316

    摘要: A method of forming silica film of low dielectric constant on a semiconductor substrate comprises (a) applying a silica solution of low dielectric constant for film deposition on a semiconductor substrate; (b) heat-treating the resulting film at 50 to 350 degrees C; and (c) baking the film at 350 to 450 degrees C in an inactive gas atmosphere containing 500 to 15,000 ppm of oxygen by volume. Preferably, the heat-treating (b) is carried out at 150 to 350 degrees C for 1 to 3 minutes in the air. Preferably, the baking (c) is carried out with the semiconductor substrate held on a hot plate maintained at 350 to 450 degrees C. According to such a method, a semiconductor substrate provided with silica film of low dielectric constant has a dielectric constant of less than 3, low moisture adsorption, and high film strength, while being free of damage to the metalized wiring on the semiconductor substrate.