PROCÉDÉ D'EXTRACTION D'UN SPECTRE DE DIFFUSION PREMIER
    6.
    发明公开
    PROCÉDÉ D'EXTRACTION D'UN SPECTRE DE DIFFUSION PREMIER 有权
    VERFAHREN ZUR EXTRAKING EINES ERSTEN STREUUNGSSPEKTRUMS

    公开(公告)号:EP2649436A1

    公开(公告)日:2013-10-16

    申请号:EP11807712.2

    申请日:2011-12-06

    IPC分类号: G01N23/04 G01N23/20

    摘要: A method and device for spectrometry analysis and for extracting a primary diffuse spectrum from a diffusion spectrum of diffuse radiation, according to a diffusion angle, coming from a material exposed to incident radiation through a surface, that includes the application of a spectral response function organized in the form of a matrix (M), known as a correlation matrix, of which each value aij corresponds with a number of detected photons, with energy Ei, constituting the multiple diffuse radiation, when a photon is detected, with energy Ej, of the primary diffuse radiation.

    摘要翻译: 一种用于光谱分析和用于从扩散辐射的扩散光谱中提取初级漫射光谱的方法和装置,根据扩散角来自暴露于通过表面的入射辐射的材料,其包括应用光谱响应函数的组织 以矩阵(M)的形式,被称为相关矩阵,其中每个值aij对应于检测到的光子的数量,其中当检测到光子时能量E 1构成多个漫射辐射,能量Ej为 主要扩散辐射。

    PROCEDE ET DISPOSITIF D'IDENTIFICATION D'UN MATERIAU D'UN OBJET
    7.
    发明公开
    PROCEDE ET DISPOSITIF D'IDENTIFICATION D'UN MATERIAU D'UN OBJET 有权
    方法和设备来识别材料的物体

    公开(公告)号:EP2457083A1

    公开(公告)日:2012-05-30

    申请号:EP10733003.7

    申请日:2010-07-19

    IPC分类号: G01N23/203 G01V5/00

    摘要: The invention relates to a device for identifying a material of an object comprising: a source of X photons (10) and a spectrometric detector (11), the source irradiating the object (100) with an incident beam (12) and the detector measuring a magnitude of a backscattered beam (13) from the incident beam after diffusion in a volume (δV) of the material and an energy of the X photons of the backscattered beam, the incident and backscattered beams forming an angle of diffusion (θ); a means (101) for adjusting the position between the source, the detector and the object in order for the volume to be at different depths with a constant angle, a means (102. a) for processing the two magnitudes in two positions and the energy in one position and for calculating an attenuation factor (μ
    matériau (E
    0 , E
    1 , ε)), a means (102. b) for estimating the density (p) of the material.