摘要:
A subject matter of the invention relates to a method for obtaining at least one semi-polar layer (480) of nitride (N), obtained using at least one from gallium (Ga), indium (In) and aluminium (Al), on an upper surface of a crystalline layer (410) made from silicon, characterised in that said method comprises the following steps: - etching, starting from the upper surface of the crystalline layer, of a plurality of parallel grooves (460) comprising at least two opposed inclined facets (330, 331), at least one (330) of said opposed facets (330, 331) having a crystalline orientation {111}; - masking the upper surface of the crystalline layer (410) in such a way that said facets (330) have a crystalline orientation {111} that is not masked; - epitaxially growing said semi-polar nitride layer (480) from said non-masked facets (330); characterised in that said etching is carried out starting from a stack comprising the crystalline layer (410) and at least one barrier layer (420) covered by the crystalline layer (30), and in that said etching etches said crystalline layer (410) in a selective manner with respect to said barrier layer (420) in such a way that said etching stops on contact with said barrier layer (420).
摘要:
A subject of the invention relates to a method making it possible to obtain, on an upper surface of a crystalline substrate (310), a semi-polar layer (480) of nitride material comprising any one from among gallium, aluminium or indium, said method comprising the following steps: obtaining, on the upper surface of the crystalline substrate, a plurality of parallel grooves (320, 410, 420) which extend in a first direction, one of said two opposite facets (330) exhibiting a {111} crystal orientation; etching a plurality of parallel slices (450) which extend in a second direction that has undergone a rotation with respect to said first direction of the grooves (320, 410, 420) in such a way as to obtain individual facets (330') exhibiting a {111} crystal orientation; epitaxial growth of said material (480) from said individual facets (330').