PROCEDE DE FABRICATION D'UN MATERIAU SEMI-CONDUCTEUR INCLUANT UNE COUCHE DE NITRURE D'ELEMENT III SEMI-POLAIRE
    1.
    发明公开
    PROCEDE DE FABRICATION D'UN MATERIAU SEMI-CONDUCTEUR INCLUANT UNE COUCHE DE NITRURE D'ELEMENT III SEMI-POLAIRE 审中-公开
    VERFAHREN ZUR HERSTELLUNG EINES HALBLEITERMATERIALS MIT EINER HALBPOLAREN III-NITRID-SCHICHT

    公开(公告)号:EP3146558A1

    公开(公告)日:2017-03-29

    申请号:EP15725563.9

    申请日:2015-05-20

    IPC分类号: H01L21/20

    摘要: The present invention relates to a method for manufacturing a semiconductor material including a semi-polar III-nitride layer, from a semi-polar starting substrate including a plurality of grooves periodically spaced apart. Each groove includes a first inclined flank having a crystallographic orientation C (0001) and a second inclined flank having a different crystallographic orientation. The method includes the phases which involve: forming (2) III-nitride crystals on the first inclined flanks of the grooves, the growth parameters of the III-nitride crystals being suitable for promoting lateral growth of said crystals such as to induce overlap of the adjacent III-nitride crystals, and continuing the growth until coalescence of the III-nitride crystals such as to form a layer of coalesced III-nitride crystals; and forming (3) a two-dimensional III-nitride layer on the layer of coalesced III-nitride crystals.

    摘要翻译: 本发明涉及包含半极性III族氮化物层的半导体材料的制造方法,该半导体材料包括周期性间隔开的多个槽的半极性起始衬底。 每个凹槽包括具有晶体取向C(0001)的第一倾斜侧面和具有不同结晶取向的第二倾斜侧面。 该方法包括以下阶段,其涉及:在槽的第一倾斜侧面上形成(2)III族氮化物晶体,III族氮化物晶体的生长参数适于促进所述晶体的横向生长,例如引起 相邻的III族氮化物晶体,并且继续生长直到III族氮化物晶体的聚结,以形成一层聚结的III族氮化物晶体; 以及在聚结的III族氮化物晶体层上形成(3)二维III族氮化物层。

    Mask for thin film deposition and method of manufacturing OLED using the same
    7.
    发明公开
    Mask for thin film deposition and method of manufacturing OLED using the same 有权
    掩模用于薄膜沉积和工艺制造OLED,从而

    公开(公告)号:EP2159299A2

    公开(公告)日:2010-03-03

    申请号:EP09161245.7

    申请日:2009-05-27

    IPC分类号: C23C14/04

    摘要: A mask for thin film deposition used in forming an organic thin film or a conductive layer in an organic light emitting device is disclosed. In one embodiment, the mask includes i) a base member, ii) a plurality of slits configured to penetrate through the base member, wherein the plurality of slits have a predetermined length and extend in a first direction, wherein the plurality of slits comprise an outermost slit positioned in an outermost in a second direction having a predetermined angle with respect to the first direction, and wherein the outermost slit comprises two sub-slits separated from each other and iii) a rib supporting part formed between and contacting the two sub-slits, wherein the rib supporting part extends from a rib which is adjacent to the outermost slit.

    Gallium nitride crystal substrate and method of producing same
    9.
    发明公开
    Gallium nitride crystal substrate and method of producing same 审中-公开
    基板由氮化镓制成,并处理它的制备

    公开(公告)号:EP1820887A3

    公开(公告)日:2009-05-20

    申请号:EP06023148.7

    申请日:2006-11-07

    IPC分类号: C30B29/40 C30B25/04

    CPC分类号: C30B29/40 C30B25/04

    摘要: A low-distortion gallium nitride crystal substrate including low dislocation single crystal regions (Z) having a definite c-axis and a definite a-axis, C-plane growth regions (Y) having a c-axis and a-axis parallel to the c-axis and a-axis of the low dislocation single crystal regions (Z), voluminous defect accumulating regions (H) having a c-axis inverse to the c-axis of the low dislocation single crystal regions (Z) and an a-axis parallel with the a-axis of the low dislocation single crystal regions (Z), and 0.1/cm 2 to 10/cm 2 c-axis gross core regions (F) containing at least one crystal having a c-axis parallel to the c-axis of the low dislocation single crystal regions (Z) and an a-axis different from the a-axis of the low dislocation single crystal regions (Z).