Abstract:
Systems, methodologies, media, and other embodiments associated with color measuring are described. One exemplary system embodiment includes a spectrophotometer (100), one or more light sources (110) for illuminating an interior of the spectrophotometer (100), and a digital camera (105) configured at a port (125) of the spectrophotometer and being configured to measure light components from a sample (115). In the present invention, segmentation logic is provided for the spectrophotometer that is configured to employ computational image segmentation to characterize specular reflection from a sample and to characterize a selected patch or portion from the test sample, such as a selected color in a multicolor pattern. In accordance with the present invention, the spectrophotometer (100) and the included digital camera (105) may be color-characterized in situ.
Abstract:
A method for determining the optimal colorant thicknesses (104) for integral CIE color-matching filters is provided. According to a computational study, a four band filter of the present invention provides a best approximation to the CIE XYZ color-matching functions with the least cost.
Abstract:
A tristimulus colorimeter on a single semiconductor chip having at least three detectors, each detector being coated by colorant filters, each filter having at least one layer and at least one filter having a double layer is provided. The colorimeter determines CIE tristimulus values of an incident light from inputs to the filters and detectors. Colorimeters having integral dye filters may be constructed on a single silicon chip embodying all the detectors and electronics, coated over each detector by a deposited filter layer. Colorants may be directly deposited on the detectors, rather than using a plastic substrate for a filter.