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公开(公告)号:EP4111487A1
公开(公告)日:2023-01-04
申请号:EP21760271.3
申请日:2021-03-01
申请人: Direct Electron, LP
发明人: BAMMES, Benjamin , BILHORN, Robert
IPC分类号: H01J37/244 , G01T1/29 , H01J37/26 , H01L27/146 , H04N5/32
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公开(公告)号:EP4333452A3
公开(公告)日:2024-05-15
申请号:EP24150794.6
申请日:2020-04-17
申请人: Direct Electron, LP
IPC分类号: H01J37/28 , H01J37/244 , G01N23/2251 , H04N23/667 , H04N23/81 , H04N25/445 , H04N25/531
CPC分类号: H01J37/244 , H01J2237/244620130101 , H01J37/28 , H01J2237/244120130101 , G01N23/2251 , G01N2223/612620130101 , H01J2237/280220130101 , H04N23/81 , H04N23/667 , H04N25/445 , H04N25/531
摘要: The present disclosure relates to transmission electron microscopy for evaluation of biological matter. According to an embodiment, the present disclosure further relates to an apparatus for determining the structure and/or elemental composition of a sample using 4D STEM, comprising a direct bombardment detector operating with global shutter readout, processing circuitry configured to acquire images of bright-field disks using either a contiguous array or non-contiguous array of detector pixel elements, correct distortions in the images, align each image of the images based on a centroid of the bright-field disk, calculate a radial profile of the images, normalize the radial profiles by a scaling factor, calculate the rotationally-averaged edge profile of the bright-field disk, and determine elemental composition within the specimen based on the characteristics of the edge profile of the bright-field disk corresponding to each specimen location.
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公开(公告)号:EP4209000A1
公开(公告)日:2023-07-12
申请号:EP21864866.5
申请日:2021-07-26
申请人: Direct Electron, LP
发明人: BAMMES, Benjamin , BILHORN, Robert
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公开(公告)号:EP4333452A2
公开(公告)日:2024-03-06
申请号:EP24150794.6
申请日:2020-04-17
申请人: Direct Electron, LP
IPC分类号: H04N25/531
摘要: The present disclosure relates to transmission electron microscopy for evaluation of biological matter. According to an embodiment, the present disclosure further relates to an apparatus for determining the structure and/or elemental composition of a sample using 4D STEM, comprising a direct bombardment detector operating with global shutter readout, processing circuitry configured to acquire images of bright-field disks using either a contiguous array or non-contiguous array of detector pixel elements, correct distortions in the images, align each image of the images based on a centroid of the bright-field disk, calculate a radial profile of the images, normalize the radial profiles by a scaling factor, calculate the rotationally-averaged edge profile of the bright-field disk, and determine elemental composition within the specimen based on the characteristics of the edge profile of the bright-field disk corresponding to each specimen location.
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公开(公告)号:EP3956919A1
公开(公告)日:2022-02-23
申请号:EP20792121.4
申请日:2020-04-17
申请人: Direct Electron, LP
发明人: BAMMES, Benjamin , BILHORN, Robert
IPC分类号: H01J37/244 , G01N23/00 , G02B26/10 , H01J37/00 , H01J37/26
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公开(公告)号:EP3956691A1
公开(公告)日:2022-02-23
申请号:EP20791905.1
申请日:2020-04-17
申请人: Direct Electron, LP
发明人: BAMMES, Benjamin , BILHORN, Robert
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