摘要:
A semiconductor logic circuit comprises a clock driver circuit (21) and a clocked circuit (22) which carries out a clocked operation responsive to an output of the clock driver circuit, where an output logic amplitude (L 1 ) of the clock driver circuit is set to a value which is greater than an internal logic amplitude (L 2 ) of the clocked circuit and is less than or equal to four times the internal logic amplitude of the clocked circuit.
摘要:
A semiconductor logic circuit comprises a clock driver circuit (21) and a clocked circuit (22) which carries out a clocked operation responsive to an output of the clock driver circuit, where an output logic amplitude (L 1 ) of the clock driver circuit is set to a value which is greater than an internal logic amplitude (L 2 ) of the clocked circuit and is less than or equal to four times the internal logic amplitude of the clocked circuit.
摘要:
This concerns a semiconductor device such as a TTL-type integrated circuit device which has an input protection circuit for each inner circuit, e.g., each TTL logic gate. The input protection circuit is formed on a semiconductor substrate (2) having a first conductivity type, and comprises: a first impurity region (1) having a second conductivity type connected to an external terminal (3a) and having an island-shape formed on the semiconductor substrate and surrounded by an isolation region (2a) having the first conductivity type; a clamp diode (D1) comprising an electrode layer (4) contacting the first impurity region (1); and a PN junction type protection diode (D3) comprising a second impurity region (9) having the first conductivity type which crosses the first impurity region (1) between the clamp diode and a portion (3) of the first impurity region (1) connected to the external terminal, and which reaches the isolation region (23a). The reverse withstand voltage of the PN junction type protection diode (D3, 9-1) is smaller than that of the clamp diode (01,4-1) thereby avoiding permanent destruction of the clamp diode.
摘要:
A logic circuit employing bipolar-transistors and including a level-shift circuit unit, in addition to a normal bipolar logic circuit, for improving a stability of the circuit upon start-up of a power supply. The logic circuit includes: an input circuit (l) receiving at least one input signal (SIN) and connected to a terminal of a power supply; a first internal circuit including a first bipolar transistor (T3), a base of which is connected to an output of the input circuit, and a level-shift circuit (D2) connected between a terminal of the first bipolar transistor and another terminal of the power supply; a level-shift circuit unit (3) connected between the terminal of the power supply and another terminal of the first bipolar transistor; a second internal circuit including a second bipolar transistor (T4) a base of which is connected to a commonly-connected point of the level-shift circuit unit and another terminal of the first bipolar transistor; and an output circuit means including a third bipolar transistor (T5) a base of which is connected to an output terminal of the second bipolar transistor, a terminal of which is connected to another terminal of the power supply and another terminal of which is provided for connection to a load circuit. A forward voltage of the level-shift circuit unit, the second internal circuit and the output circuit is higher than a forward voltage of the first internal circuit. The first to third bipolar transistors have the same operational polarities.
摘要:
The present invention relates to a logic circuit which reduces occurrence of breakdown of a pull-down transistor (T 3 ) and a pull-up transistor (T 4 ; T a ) in the output stage when a high voltage is applied to the power supply line and ensures high voltage resistance. The logic circuit of the present invention controls the pull-up transistor (T 4 ; T,) provided between a first power supply (V cc ) and an output terminal (OUT) for ON and OFF with a collector voltage of a phase splitter transistor (T 2 ) and controls the pull-down transistor (T 3 ) provided between the second power supply (GND) and the output terminal (OUT) with an emitter voltage. Breakdown of said pull-down and pull-up transistors (T 3 ; T 4 ; T.) can be reduced and a high voltage resistance is ensured by providing a protection circuit (P) which discharges the base of pull-down transistor (T 3 ) and turns OFF said pull-down transistor (T 3 ) by detecting a voltage difference between the first power supply (V cc ) and the second power supply (GND) when it exceeds the specified value.
摘要:
The present invention relates to a logic circuit which reduces occurrence of breakdown of a pull-down transistor (T 3 ) and a pull-up transistor (T 4 ; T a ) in the output stage when a high voltage is applied to the power supply line and ensures high voltage resistance. The logic circuit of the present invention controls the pull-up transistor (T 4 ; T,) provided between a first power supply (V cc ) and an output terminal (OUT) for ON and OFF with a collector voltage of a phase splitter transistor (T 2 ) and controls the pull-down transistor (T 3 ) provided between the second power supply (GND) and the output terminal (OUT) with an emitter voltage. Breakdown of said pull-down and pull-up transistors (T 3 ; T 4 ; T.) can be reduced and a high voltage resistance is ensured by providing a protection circuit (P) which discharges the base of pull-down transistor (T 3 ) and turns OFF said pull-down transistor (T 3 ) by detecting a voltage difference between the first power supply (V cc ) and the second power supply (GND) when it exceeds the specified value.
摘要:
Electrostatical breakage of a semiconductor device comprising an epitaxial layer (106) and a buried layer (104) thereunder connected with an outer signal terminal (114-116) can be prevented by forming an impurity region (118) in the epitaxial layer so as to make a PN junction between the buried layer and the impurity region, the impurity region being connected with a power source or ground.