Resin-molded semiconductor devices and a process for manufacturing the same
    1.
    发明公开
    Resin-molded semiconductor devices and a process for manufacturing the same 失效
    树脂模制半导体器件及其制造方法

    公开(公告)号:EP0111932A3

    公开(公告)日:1985-08-28

    申请号:EP83112853

    申请日:1983-12-20

    申请人: HITACHI, LTD.

    IPC分类号: H01L21/56 H01L23/30

    摘要: The invention relates to resin-molded axial lead-type semiconductor devices comprising a sub-assembly consisting of a semiconductor pellet (1) brazed between a pair of axial leads (5). The sub-assembly is sealed in an epoxy resin, which is formed by applying an epoxy resin, preferably a one-can-epoxy resin, onto the sub-assembly followed by curing the epoxy resin. Preferably, an epoxy resin having a thixotropic index of 1.0 to 2.5 and a gelation time 0.8 to 3 minutes is used. The invention further relates to a process for manufacturing these semiconductor devices which is characterised by:
    (A) horizontally holding the sub-assembly and dropping a predetermined amount of an epoxy resin onto the semiconductor pellet while turning the sub-assembly with the axial leads as rotation axis, (B) curing the epoxy resin, preferably by heating at 160° to 180°C for a period of 2 to 10 min, while turning the sub-assembly, so that the surface portions of the epoxy resin are cured, and (C) curing the epoxy resin, preferably by heating at 160° to 200°C for a period of 3 to 24 h while maintaining the sub-assembly stationary without turning it, so that the epoxy resin is completely hardened.

    Resin-molded semiconductor devices and a process for manufacturing the same
    3.
    发明公开
    Resin-molded semiconductor devices and a process for manufacturing the same 失效
    Harzgekapselte Halbleiteranordnungen und ein Verfahren zum Herstellen derselben。

    公开(公告)号:EP0111932A2

    公开(公告)日:1984-06-27

    申请号:EP83112853.3

    申请日:1983-12-20

    申请人: HITACHI, LTD.

    IPC分类号: H01L21/56 H01L23/30

    摘要: The invention relates to resin-molded axial lead-type semiconductor devices comprising a sub-assembly consisting of a semiconductor pellet (1) brazed between a pair of axial leads (5). The sub-assembly is sealed in an epoxy resin, which is formed by applying an epoxy resin, preferably a one-can-epoxy resin, onto the sub-assembly followed by curing the epoxy resin. Preferably, an epoxy resin having a thixotropic index of 1.0 to 2.5 and a gelation time 0.8 to 3 minutes is used.
    The invention further relates to a process for manufacturing these semiconductor devices which is characterised by:

    (A) horizontally holding the sub-assembly and dropping a predetermined amount of an epoxy resin onto the semiconductor pellet while turning the sub-assembly with the axial leads as rotation axis,
    (B) curing the epoxy resin, preferably by heating at 160° to 180°C for a period of 2 to 10 min, while turning the sub-assembly, so that the surface portions of the epoxy resin are cured, and
    (C) curing the epoxy resin, preferably by heating at 160° to 200°C for a period of 3 to 24 h while maintaining the sub-assembly stationary without turning it, so that the epoxy resin is completely hardened.

    摘要翻译: 本发明涉及树脂模制的轴向引线型半导体器件,其包括由钎焊在一对轴向引线(5)之间的半导体芯片(1)组成的子组件。 该子组件被密封在环氧树脂中,环氧树脂通过将环氧树脂(优选一罐环氧树脂)施加到子组件上,随后固化环氧树脂而形成。 优选使用触变指数为1.0〜2.5,凝胶化时间为0.8〜3分钟的环氧树脂。 本发明还涉及一种制造这些半导体器件的方法,其特征在于:(A)水平保持子组件并将预定量的环氧树脂滴落到半导体芯片上, 装配轴向引线作为旋转轴,...(B)固化环氧树脂,优选在160°至180°加热2至10分钟的时间,同时转动子组件,使表面部分 环氧树脂固化,(C)固化环氧树脂,优选在160〜200℃下加热3〜24小时,同时保持组件不转动,使环氧树脂成为 完全硬化。