摘要:
The generation of a pseudo-lock is prevented in a JFB offset compensator whose use has been conventionally limited due to a tendency to generate the pseudo-lock, and performance degradation of a PLL and a Viterbi decoder is suppressed. A means for monitoring an offset of a read signal is provided independently from the JFB offset compensator. With this configuration, the generation or a possibility of the generation of the pseudo-lock can be detected to reset an integrator. In order to reduce the influence of a large sporadic offset triggering the pseudo-lock, there may also be provided a limitter for limiting the absolute value of an offset signal inputted to the integrator or a limitter for limiting the absolute value of an offset compensation signal.
摘要:
The generation of a pseudo-lock is prevented in a JFB offset compensator whose use has been conventionally limited due to a tendency to generate the pseudo-lock, and performance degradation of a PLL and a Viterbi decoder is suppressed. A means for monitoring an offset of a read signal is provided independently from the JFB offset compensator. With this configuration, the generation or a possibility of the generation of the pseudo-lock can be detected to reset an integrator. In order to reduce the influence of a large sporadic offset triggering the pseudo-lock, there may also be provided a limitter for limiting the absolute value of an offset signal inputted to the integrator or a limitter for limiting the absolute value of an offset compensation signal.
摘要:
A scanning probe microscope in which the deflection of a cantilever (1, 104) caused by the proximity between a stylus (17, 109) and a sample (2) is detected, the relative distance between the sample and a probe at which the level of the deflection detection signal coincides with a reference level is subjected to servo control thereby to control the force exerted on the stylus to a constant level, and the relative positions of the sample and the probe are scanned to produce a three-dimensional image of the surface of the sample. In order to eliminate the error of servo control attributable to the deformation of the cantilever, the deflection detection signal is held with the cantilever set in free standing state, and the signal thus held is used to correct the level of the cantilever deflection detection signal. The servo control is effected by the detection signal thus corrected.
摘要:
A surface observing apparatus for obtaining information of a specimen comprises a probe (17) disposed in the close vicinity of the specimen (2), a deformable cantilever (1) for holding the probe (17), a scanning mechanism for scanning a surface of the specimen with the probe (17), and detectors (3, 4, 5) for detecting displacements of the cantilever (1) to thereby allow information of the specimen to be derived on the basis of the displacement of the cantilever (1). The apparatus further comprise a first detector (9) for detecting a force acting on the probe from the displacement of the cantilever, and a second detector (7) for measuring a change in the force acting on the probe on the basis of the displacement of the cantilever.
摘要:
The invention relates to a high-speed optical disk drive. If the read speed is increased while the high-frequency modulated carrier is fixed at a constant frequency, it becomes difficult to separate the read signal from the carrier by using bandwidth limitation of the analog system because the upper limit of the read signal band nears to the carrier frequency. Moreover, if the separation between them is eased by raising the carrier frequency, a problem that write-waveform controls become difficult arises. However, the carrier amplitude can be suppressed simultaneously preventing leakage to the read signal band by converting the carrier frequency into the stop-band of the adaptive equalizer by making the use of aliasing that occurs at the A/D conversion.
摘要:
A scanning probe microscope in which the deflection of a cantilever (1, 104) caused by the proximity between a stylus (17, 109) and a sample (2) is detected, the relative distance between the sample and a probe at which the level of the deflection detection signal coincides with a reference level is subjected to servo control thereby to control the force exerted on the stylus to a constant level, and the relative positions of the sample and the probe are scanned to produce a three-dimensional image of the surface of the sample. In order to eliminate the error of servo control attributable to the deformation of the cantilever, the deflection detection signal is held with the cantilever set in free standing state, and the signal thus held is used to correct the level of the cantilever deflection detection signal. The servo control is effected by the detection signal thus corrected.