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1.发明公开
公开(公告)号：EP4143504A1
公开(公告)日：2023-03-08
申请号：EP21721106.9
申请日：2021-04-27
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公开(公告)号：EP4143505A1
公开(公告)日：2023-03-08
申请号：EP21721108.5
申请日：2021-04-27
申请人： COMPAGNIE GENERALE DES ETABLISSEMENTS MICHELIN , CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE , UNIVERSITE PAUL SABATIER TOULOUSE III , Institut National Polytechnique de Toulouse
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3.发明授权DISPOSITIF OPTIQUE DE MESURE D'UN PARAMÈTRE PHYSIQUE ET PROCÉDÉ ASSOCIÉ 有权DISPOSITIF OPTIQUE DE MESURE D'UNPARAMÈTREPHYSIQUE ETPROCÉDÉASSOCIÉ
公开(公告)号：EP3019822B1
公开(公告)日：2017-05-17
申请号：EP14738460.6
申请日：2014-07-04
申请人： Institut National Polytechnique de Toulouse (INPT) , Centre National de la Recherche Scientifique (C.N.R.S.)
IPC分类号： G01B9/02
CPC分类号： G01J9/02 , G01B9/02083 , G01B9/02092
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4.发明公开DISPOSITIF D'AMPLIFICATION ANALOGIQUE DESTINE NOTAMMENT A UN ANEMOMETRE LASER 审中-公开模拟增益装置，特别是对于激光风速计
公开(公告)号：EP2888815A1
公开(公告)日：2015-07-01
申请号：EP13773285.5
申请日：2013-08-14
发明人： BONY, Francis , TEYSSEYRE, Raphaël
CPC分类号： G01P5/26 , H03F1/56 , H03F3/087 , H03F3/45071 , H03F3/45475 , H03F3/50 , H03F2200/285 , H03F2200/405 , H03F2200/42 , H03F2200/54 , H03F2200/555 , H03F2200/69 , H03F2200/72 , H03F2203/45051 , H03F2203/45112 , H03F2203/45528 , H03F2203/45544 , H03F2203/45594 , H03F2203/5036
摘要： This analogue amplification device comprises -a first stage (28) with common-base transistor (36) receiving the modulated input current entering its emitter, and the output signal leaving this first stage corresponds to the signal of the collector, - a second stage (30) is formed by a follower amplifier comprising a transistor (38) with common drain or collector setup, a third stage (52) comprises a transistor (40) with common emitter setup, and - a fourth stage (34) is an amplifier stage with means making it possible to carry out, on the one hand, an amplification and, on the other hand, a matching of impedance. Application to a laser anemometer with optical retro-injection.
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公开(公告)号：EP2569593A1
公开(公告)日：2013-03-20
申请号：EP11719251.8
申请日：2011-05-10
发明人： BERNAL, Olivier , BONY, Francis , BOSCH, Thierry , ZABIT, Usman
CPC分类号： G01B9/02072 , G01B9/0207 , G01B9/02092 , G01S7/4916 , G01S7/497 , G01S17/32 , G01S17/50 , H01S5/0028 , H01S5/0656
摘要： The invention relates to a device for the optical measurement (10) of a parameter comprising: a laser light source (11) for generating a measurement beam in the direction of a target (20) and for receiving the measurement beam reflected by said target, said measurement beam travelling an optical path the variation of which is a function of the physical parameter being determined, and said laser light source comprising an optical cavity (111), a motion sensor (14) for the laser light source (11), means (15) for calculating the physical parameter from a signal measured at the laser light source (11) and a signal measured by the motion sensor (14).
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6.发明公开
公开(公告)号：EP4143503A1
公开(公告)日：2023-03-08
申请号：EP21721103.6
申请日：2021-04-27
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7.发明公开
公开(公告)号：EP3019822A1
公开(公告)日：2016-05-18
申请号：EP14738460.6
申请日：2014-07-04
申请人： Institut National Polytechnique de Toulouse (INPT) , Centre National de la Recherche Scientifique (CNRS)
IPC分类号： G01B9/02
CPC分类号： G01J9/02 , G01B9/02083 , G01B9/02092
摘要： The invention relates to an optical device (10) for determining a physical parameter which comprises: a laser diode (11) for emitting a beam toward a target; a means for detecting (13) an interferometric signal SM(t) which comprises the information on the physical parameter to be determined, and which is generated by an interference between the emitted beam and a light beam reflected by the target; means for converting (15) the signal SM(t) obtained by the detection means (13) into a measurement of the physical parameter, said conversion means (15) comprising: first means (17) for suppressing a continuous component Off(t) of the interferometric signal SM(t); second means (18) for determining interferometric peaks in the interferometric signal SM(t) obtained from the signal obtained at the output of the first means (17). The invention also relates to an associated method. Said method is particularly suitable for speckle interferometric signals.
摘要翻译： 测定的物理参数的光学装置（10）包括：用于发射朝向目标的光束的激光二极管（11）; 关于检测（13）上的干涉信号SM（t）的其中包括关于所述物理参数的信息，是确定的开采，并且所有这是由于所发射的光束和由目标反射的光束之间的干涉生成的元件; firstElement（17）用于抑制直流分量关闭（吨）：包含由所述检测元件（13）中获得到的物理参数的测量，所述转换元件（15）元件，用于将（15）的信号SM（t）的 干涉信号SM（t）的; secondElement（18），用于在从在所述第一元件（17）的输出端获得的信号而获得的干涉信号SM（t）的确定性采矿干涉峰。 相关的方法，特别是适合于散斑干涉信号从而进行说明。
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公开(公告)号：EP2569593B1
公开(公告)日：2014-12-03
申请号：EP11719251.8
申请日：2011-05-10
发明人： BERNAL, Olivier , BONY, Francis , BOSCH, Thierry , ZABIT, Usman
CPC分类号： G01B9/02072 , G01B9/0207 , G01B9/02092 , G01S7/4916 , G01S7/497 , G01S17/32 , G01S17/50 , H01S5/0028 , H01S5/0656
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