摘要:
Measuring apparatus comprises a rotating plate 17, a torque detection plate 18 disposed on a same axis parallel to the plate 17 with a given gap, a torque sensor about the plate 18 through the specimen held between two plates. The plate 18 is a total reflection prism which is made from a material that has a greater refractive index than the specimen and transmits UV and infrared light. An ultraviolet beam is directed onto the specimen through the prism. An infrared beam is directed into the prism. The infrared beam emerging from the prism after total reflection from the interface between the prism and the specimen is detected. A signal processor analyzes the infrared absorption spectrum of the specimen on the basis of the infrared beam. While the viscosity of the specimen in the curing process is measured, the signal processor simultaneously measures the infrared absorption spectrum.
摘要:
The object of the invention is to provide an infrared circular dichroism measuring apparatus that improves the measuring time and the measuring accuracy. An infrared circular dichroism measuring apparatus 101 comprising: AC signal extractors 110-112 where an interference light beam from an IR light source 102 which has passed an interferometer 103 is converted into a clockwise and a counterclockwise circularly polarized light beams and is irradiated on a sample to extract from a detected signal of detector 107 an interferogram by each of the circularly polarized light beams; DC signal extractors 113, 112 for extracting an interferogram by the IR absorption of the sample; a calculator 114 for figuring out the circular dichroism; and a selective transmitter 120 for narrowing down the wavelength region to be measured based on an IR absorption wavelength region corresponding to a vibration mode of the structure to be measured in the sample molecule.
摘要:
Measuring apparatus comprises a rotating plate 17, a torque detection plate 18 disposed on a same axis parallel to the plate 17 with a given gap, a torque sensor about the plate 18 through the specimen held between two plates. The plate 18 is a total reflection prism which is made from a material that has a greater refractive index than the specimen and transmits UV and infrared light. An ultraviolet beam is directed onto the specimen through the prism. An infrared beam is directed into the prism. The infrared beam emerging from the prism after total reflection from the interface between the prism and the specimen is detected. A signal processor analyzes the infrared absorption spectrum of the specimen on the basis of the infrared beam. While the viscosity of the specimen in the curing process is measured, the signal processor simultaneously measures the infrared absorption spectrum.
摘要:
Measuring apparatus comprises a rotating plate 17, a torque detection plate 18 disposed on a same axis parallel to the plate 17 with a given gap, a torque sensor about the plate 18 through the specimen held between two plates. The plate 18 is a total reflection prism which is made from a material that has a greater refractive index than the specimen and transmits UV and infrared light. An ultraviolet beam is directed onto the specimen through the prism. An infrared beam is directed into the prism. The infrared beam emerging from the prism after total reflection from the interface between the prism and the specimen is detected. A signal processor analyzes the infrared absorption spectrum of the specimen on the basis of the infrared beam. While the viscosity of the specimen in the curing process is measured, the signal processor simultaneously measures the infrared absorption spectrum.
摘要:
An object of the present invention is to provide a total reflection measuring apparatus which, while visually observing a specific minute area of a measurement object, is capable of efficiently obtaining optical data on the basis of the total reflection measurement. A microscopic total reflection measuring apparatus of the present invention comprises a Cassegrain mirror 12 having a Cassegrain primary mirror 16 and a Cassegrain secondary mirror 18, which condenses an incident light beam 30 on a measurement object 20 by making an incident light beam successively reflected by the secondary mirror 18 and the primary mirror 16, and which obtains a reflected light beam 32 from the measurement object 20 by making the reflected light beam 32 successively reflected by the primary mirror 16 and the secondary mirror 18. And, a total reflection prism 14 is arranged below the Cassegrain secondary mirror 18. And the incident light beam includes a visible light beam for visual observation and a measurement light beam for acquisition of analysis information, and present invention comprises a visible light filter which separates at least one of the incident light beam to the total reflection prism and the reflected light beam from the total reflection prism 14 into a total reflection area B and a normal reflection area A, and which removes, from the one of the incident light beam and the reflected light beam, the visible light beam in the total reflection area B.
摘要:
A microscopic-measurement apparatus capable of conducting measurement successively in several set areas regardless of the type of stage driving system or the precision of the stage driving system. The microscopic-measurement apparatus for acquiring optical information from desired portions of a sample by moving a measuring optical axis on a surface of the sample includes an observation-image display section for displaying a sample surface image as an observation image, in a range of visual field which is observable at a present sample position; an optical-axis display section for displaying areas to be measured and a present position of the measuring optical axis in an overlapped state with the observation image; an area setting section capable of setting measuring areas by expanding, reducing, changing in shape and moving the areas to be measured; and an optical-information acquisition section for measuring one set measuring area or several set measuring areas successively with an instruction of starting measurement.