公开(公告)号：EP3407036A1

公开(公告)日：2018-11-28

申请号：EP18173154.8

申请日：2018-05-18

Applicant: Kaiser Optical Systems Inc.

Inventor： Schipper, Darren ,  Slater, Joseph B. ,  Tedesco, James M.

IPC: G01J3/02 ,  G01J3/28

CPC classification number: G01J3/027 ,  G01J3/0264 ,  G01J3/28 ,  G01J3/42 ,  G01J2003/283

Abstract: The present disclosure relates to assistive mechanisms and methods that aid an operator of a spectrometer to make spectral measurements of a sample, the measurements having a desired quality. The method enables quality spectral measurements quickly and simply, without a prior understanding of a sample's spectrum or of the details as to how the spectrum is measured. Data quality is improved, and the time required to collect the data is reduced. While a specific example of sample optic focus is disclosed in detail, the optimization of numerous other parameters is possible.