SYSTEM AND METHOD FOR LIMITING THE EFFECTIVE COHERENCE LENGTH OF A SOLID-STATE LASER IN HOLOGRAPHIC RECORDING

    公开(公告)号:EP3690555A1

    公开(公告)日:2020-08-05

    申请号:EP20151142.5

    申请日:2020-01-10

    Abstract: The effective coherence length of a single-frequency, solid-state laser is limited to reduce spurious, secondary holograms in conjunction with a holographic recording. The wavelength of the laser is varied or 'scanned' with high precision over a very small wavelength range. In an embodiment, the temperature of the laser's resonant cavity optical bench is altered, causing the dimension of the cavity to change and the emission wavelength to move in a controlled manner. The changing wavelength is monitored at high resolution, and a feedback control loop updates the temperature set-point to keep the monitored laser wavelength moving at a desired rate of change through a desired range. As the wavelength of the laser is scanned, the phase of the holographic interference pattern is locked at a position of maximum coherence/contrast within the holographic film aperture.

    SYSTEM AND METHOD FOR IMPROVING CALIBRATION TRANSFER BETWEEN MULTIPLE RAMAN ANALYZER INSTALLATIONS

    公开(公告)号:EP3940357A1

    公开(公告)日:2022-01-19

    申请号:EP21183863.6

    申请日:2021-07-06

    Abstract: A method for harmonizing the responses of a plurality of Raman analyzers includes steps of calibrating an intensity axis response of a spectrometer to a reference light source and measuring a laser wavelength of a laser using the spectrometer. The method also includes steps of measuring a fluorescence spectrum induced by the laser at the laser wavelength of a plurality of standard reference material samples using the spectrometer, measuring a temperature of each standard reference material sample while measuring the fluorescence spectrum, and correcting the fluorescence spectrum of each standard reference material sample based on the respective temperature. The method further includes steps of deploying each standard reference material sample in one of a plurality of field calibrator devices and calibrating the intensity axis of one of the Raman analyzers using one of the field calibrator devices and the corrected fluorescence spectrum of the respective standard reference material sample.

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