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公开(公告)号：EP3992574A1
公开(公告)日：2022-05-04
申请号：EP20832482.2
申请日：2020-06-29
Applicant: Koh Young Technology Inc.
Inventor： LEE, Chan Kwon , JEON, Moon Young , HONG, Deok Hwa , JEONG, Joong Ki
Abstract: The present disclosure proposes an apparatus for determining a first three-dimensional shape of an object. The apparatus according to the present disclosure includes a first light source configured to irradiate one or more first pattern lights to the object, one or more first image sensors configured to capture one or more first reflected lights generated by reflecting the one or more first pattern lights from the object, a second light source configured to sequentially irradiate one or more second pattern lights having one phase range, a beam splitter and one or more lenses configured to change optical paths of the one or more second pattern lights so that the lights corresponding to respective phases of the phase range reach a partial area of an upper surface of the object in a dispersed manner, a second image sensor configured to capture one or more second reflected lights generated by reflecting the one or more second pattern lights from the partial area, and a processor electrically connected to the first light source, the one or more first image sensors, the second light source and the second image sensor. The processor is configured to determine the first three-dimensional shape of the object based on the one or more first reflected lights and the one or more second reflected lights.
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公开(公告)号：EP3992576A1
公开(公告)日：2022-05-04
申请号：EP20833192.6
申请日：2020-06-29
Applicant: Koh Young Technology Inc.
Inventor： LEE, Chan Kwon , JEON, Moon Young , HONG, Deok Hwa , JEONG, Joong Ki
Abstract: The present disclosure proposes a detachable second apparatus coupled to a first apparatus for determining a first three-dimensional shape of an object located on a reference plane and configured to determine an angle of an upper surface of the object with respect to the reference plane. The second apparatus according to the present disclosure includes a first light source configured to sequentially irradiate one or more first pattern lights having one phase range, a beam splitter and one or more lenses configured to change optical paths of the one or more first pattern lights so that the lights corresponding to respective phases of the phase range reach a partial area of the upper surface of the object in a dispersed manner, a communication interface configured to communicate with the first apparatus, and a first processor electrically connected to the first light source and the communication interface. The first processor is configured to obtain, from the first apparatus, first information on one or more first reflected lights generated by reflecting the one or more first pattern lights from the partial area and is configured to determine the angle of the upper surface with respect to the reference plane based on the first information.
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公开(公告)号：EP3761013A1
公开(公告)日：2021-01-06
申请号：EP19756876.9
申请日：2019-02-26
Applicant: Koh Young Technology Inc
Inventor： LEE, Se Rin , KANG, Jin Man , JEONG, Joong Ki , SON, Jung Ho , YOON, Min Cheol
IPC: G01N21/956 , G01N21/88 , G06N20/00
Abstract: A printed circuit board inspection apparatus can inspect a mounting state of a component by generating depth information on the component by using a pattern of light reflected from the component mounted on a printed circuit board received by an image sensor, generating two-dimensional image data for the component by using at least one of light of a first wavelength, light of a second wavelength, light of a third wavelength, and light of a fourth wavelength reflected from the component received by a first image sensor, inputting the depth information and the two-dimensional image data for the component into a machine learning-based model, obtaining depth information with reduced noise from the machine learning-based model, and using the noise-reduced information.
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公开(公告)号：EP4471371A3
公开(公告)日：2025-02-26
申请号：EP24206879.9
申请日：2020-06-29
Applicant: Koh Young Technology Inc.
Inventor： LEE, Chan Kwon , JEON, Moon Young , HONG, Deok Hwa , JEONG, Joong Ki
Abstract: The present disclosure proposed a detachable second apparatus coupled to a first apparatus that determines a first three-dimensional shape of an object located on a reference plane, and configured to determine an angle of an upper surface of the object with respect to the reference plane, the second apparatus comprising: a first light source configured to sequentially irradiate one or more first pattern lights having one phase range; a beam splitter and one or more lenses configured to change optical paths of the one or more first pattern lights so that a beam of light corresponding to a respective phase of the phase range spreads, and arrives at each point of a partial region of the upper surface of the object; a communication interface configured to communicate with the first apparatus; and a first processor that is electrically connected to the first light source and the communication interface, and that is configured to: obtain, from the first apparatus, first information on one or more first reflected lights generated by reflecting the one or more first pattern lights from the partial region; generate second information indicating the angle of the upper surface with respect to the reference plane based on the first information; and control the communication interface to obtain the first three-dimensional shape of the object based on each of phase changes of one or more second reflected lights from one or more second pattern lights, wherein the first information includes information indicating each light amount value of the one or more first reflected lights, and wherein the second information is used to determine a second three-dimensional shape of the object by correcting the upper surface of the object indicated by the first three-dimensional shape.
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公开(公告)号：EP4471371A2
公开(公告)日：2024-12-04
申请号：EP24206879.9
申请日：2020-06-29
Applicant: Koh Young Technology Inc.
Inventor： LEE, Chan Kwon , JEON, Moon Young , HONG, Deok Hwa , JEONG, Joong Ki
IPC: G01B11/30
Abstract: The present disclosure proposed a detachable second apparatus coupled to a first apparatus that determines a first three-dimensional shape of an object located on a reference plane, and configured to determine an angle of an upper surface of the object with respect to the reference plane, the second apparatus comprising: a first light source configured to sequentially irradiate one or more first pattern lights having one phase range; a beam splitter and one or more lenses configured to change optical paths of the one or more first pattern lights so that a beam of light corresponding to a respective phase of the phase range spreads, and arrives at each point of a partial region of the upper surface of the object; a communication interface configured to communicate with the first apparatus; and a first processor that is electrically connected to the first light source and the communication interface, and that is configured to: obtain, from the first apparatus, first information on one or more first reflected lights generated by reflecting the one or more first pattern lights from the partial region; generate second information indicating the angle of the upper surface with respect to the reference plane based on the first information; and control the communication interface to obtain the first three-dimensional shape of the object based on each of phase changes of one or more second reflected lights from one or more second pattern lights, wherein the first information includes information indicating each light amount value of the one or more first reflected lights, and wherein the second information is used to determine a second three-dimensional shape of the object by correcting the upper surface of the object indicated by the first three-dimensional shape.
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Patent Agency Ranking
公开(公告)号：EP3761772A1
公开(公告)日：2021-01-06
申请号：EP19756511.2
申请日：2019-02-26
Applicant: Koh Young Technology Inc
Inventor： LEE, Se Rin , KANG, Jin Man , JEONG, Joong Ki , SON, Jung Ho , YOON, Min Cheol
Abstract: A printed circuit board inspection apparatus can inspect the mounting state of a component by generating depth information on the component mounted on a printed circuit board by using a pattern of light reflected from the component and received by an image sensor, inputting the generated depth information into a machine-learning-based model, obtaining depth information with reduced noise from the machine-learning-based model, and using depth information with reduced noise.
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公开(公告)号：EP4492438A2
公开(公告)日：2025-01-15
申请号：EP24215317.9
申请日：2020-06-29
Applicant: Koh Young Technology Inc.
Inventor： LEE, Chan Kwon , JEON, Moon Young , HONG, Deok Hwa , JEONG, Joong Ki
IPC: H01L21/66
Abstract: The present disclosure proposes an apparatus 1400 for determining a first three-dimensional shape of an object located on a reference plane, comprising: a first light source 1410 configured to irradiate one or more first pattern lights to the object; one or more first image sensors 1420 configured to capture one or more first reflected lights generated by reflecting the one or more first pattern lights from the object; a second light source 1430 configured to sequentially irradiate one or more second pattern lights having one phase range; a first iris 1452 configured to pass the one or more second pattern lights irradiated from the second light source 1430 toward a beam splitter 1440; the beam splitter 1440 and one or more lenses 1450 configured to change optical paths of the one or more second pattern lights passing through the first iris 1452 so that a beam of light corresponding to a respective phase of the phase range spreads, and arrives at each point of a partial region of an upper surface of the object; a second iris 1472 configured to pass one or more second reflected lights, generated by the reflection of the one or more second pattern lights from the partial region, toward a second image sensor 1460; the second image sensor 1460 configured to capture the one or more second reflected lights passing through the second iris 1472; and a processor 1510 that is electrically connected to the first light source 1410, the one or more first image sensors 1420, the second light source 1430 and the second image sensor 1460, and that is configured to determine the first three-dimensional shape of the object based on the one or more first reflected lights and the one or more second reflected lights, and wherein each of the one or more second pattern lights is a pattern light generated by phase-shifting a pattern light having a pattern in the first direction or the second direction by an integer multiple of a preset phase interval. The present disclosure further discloses a corresponding method.
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公开(公告)号：EP4488622A2
公开(公告)日：2025-01-08
申请号：EP24215144.7
申请日：2020-06-29
Applicant: Koh Young Technology Inc
Inventor： LEE, Chan Kwon , JEON, Moon Young , HONG, Deok Hwa , JEONG, Joong Ki
IPC: G01B11/30
Abstract: The present disclosure proposes an apparatus for determining a first three-dimensional shape of an object located on a reference plane, comprising: one or more first light sources configured to irradiate one or more first pattern lights to the object; a second light source configured to sequentially irradiate one or more second pattern lights having one phase range;
a first iris configured to pass the one or more second pattern lights irradiated from the second light source toward a beam splitter; the beam splitter and one or more lenses configured to change optical paths of the one or more second pattern lights passing through the first iris so that a beam of light corresponding to a respective phase of the phase range spreads, and arrives at each point of a partial region of an upper surface of the object; a second iris configured to pass one or more second reflected lights, generated by the reflection of the one or more second pattern lights from the partial region, toward an image sensor; the image sensor configured to capture one or more first reflected lights generated by reflecting the one or more first pattern lights from the object and the one or more second reflected lights passing through the second iris; and a processor that is electrically connected to the one or more first light sources, the second light source and the image sensor, and that is configured to determine the first three-dimensional shape of the object based on the one or more first reflected lights and the one or more second reflected lights, and wherein each of the one or more second pattern lights is a pattern light generated by phase-shifting a pattern light having a pattern in a first direction or a second direction perpendicular to the first direction by an integer multiple of a preset phase interval.-
公开(公告)号：EP3992575A1
公开(公告)日：2022-05-04
申请号：EP20832687.6
申请日：2020-06-29
Applicant: Koh Young Technology Inc.
Inventor： LEE, Chan Kwon , JEON, Moon Young , HONG, Deok Hwa , JEONG, Joong Ki
Abstract: The present disclosure proposes an apparatus for determining a first three-dimensional shape of an object. The apparatus according to the present disclosure includes one or more first light sources configured to irradiate one or more first pattern lights to the object, a second light source configured to sequentially irradiate one or more second pattern lights having one phase range, a beam splitter and one or more lenses configured to change optical paths of the one or more second pattern lights so that the lights corresponding to respective phases of the phase range reach a partial area of an upper surface of the object in a dispersed manner, an image sensor configured to capture one or more first reflected lights generated by reflecting the one or more first pattern lights from the object and one or more second reflected lights generated by reflecting the one or more second pattern lights from the partial area, and a processor electrically connected to the one or more first light sources, the second light source and the image sensor. The processor may determine the first three-dimensional shape of the object based on the one or more first reflected lights and the one or more second reflected lights.
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公开(公告)号：EP2853855B1
公开(公告)日：2016-12-07
申请号：EP13794392.4
申请日：2013-05-22
Applicant: Koh Young Technology Inc.
Inventor： JEONG, Joong Ki , HONG, Deok-Hwa
IPC: G01B11/25
CPC classification number: G01B11/14 , G01B11/0608 , G01B11/2513 , G01B11/2531 , G01B2210/56
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