公开(公告)号：EP3201958A1

公开(公告)日：2017-08-09

申请号：EP14903117.1

申请日：2014-09-29

申请人： LG Display Co., Ltd.

发明人： ZHANG, Zhen ,  DRZAIC, Paul, Stephen ,  KWON, Seyeoul ,  YOUN, Sangcheon ,  YANG, Heeseok ,  LEE, Chanwoo ,  JO, Soyoung ,  HA, Anna ,  KIM, Dongyoon ,  LEE, Saemleenuri ,  CHO, Yoondong

IPC分类号： H01L51/00

CPC分类号： G09F9/301 ,  G06F1/1652 ,  G06F3/0412 ,  G06F2203/04102 ,  G06F2203/04103 ,  H01L27/3276 ,  H01L27/3279 ,  H01L27/3288 ,  H01L27/329 ,  H01L27/3297 ,  H01L51/0097 ,  H01L51/56 ,  H01L2251/5338 ,  H04M1/0268 ,  Y02E10/549

摘要： A conductive trace design is described that minimizes the possibility of crack initiation and propagation in conductive traces during bending. The conductive trace design has a winding trace pattern that is more resistant to the formation of cracks at high stress points in the conductive traces. The conductive trace design includes a cap that helps ensure electrical connection of the conductive trace even though one or more cracks may begin to form in the conductive portion of the conductive trace.

摘要翻译： 描述了导电迹线设计，其使弯曲期间导电迹线中的裂纹发生和传播的可能性最小化。 导电迹线设计具有绕组迹线图案，其在导电迹线中的高应力点处更能抵抗裂纹的形成。 导电迹线设计包括帽，其有助于确保导电迹线的电连接，即使在导电迹线的导电部分中可能开始形成一个或多个裂缝。

公开(公告)号：EP3201964B1

公开(公告)日：2020-11-18

申请号：EP14903089.2

申请日：2014-09-29

申请人： LG Display Co., Ltd.

发明人： ZHANG, Zhen ,  DRZAIC, Paul, Stephen ,  KWON, Seyeoul ,  YOUN, Sangcheon ,  YANG, Heeseok ,  LEE, Chanwoo ,  JO, Soyoung ,  HA, Anna ,  KIM, Dongyoon ,  LEE, Saemleenuri ,  CHO, Yoondong

IPC分类号： H01L51/56 ,  G06F1/16 ,  G09F9/30 ,  H01L51/00 ,  H01L27/32 ,  H04M1/02 ,  H05K1/02

公开(公告)号：EP3201958B1

公开(公告)日：2020-08-26

申请号：EP14903117.1

申请日：2014-09-29

申请人： LG Display Co., Ltd.

发明人： ZHANG, Zhen ,  DRZAIC, Paul, Stephen ,  KWON, Seyeoul ,  YOUN, Sangcheon ,  YANG, Heeseok ,  LEE, Chanwoo ,  JO, Soyoung ,  HA, Anna ,  KIM, Dongyoon ,  LEE, Saemleenuri ,  CHO, Yoondong

IPC分类号： H01L51/00 ,  H01L27/32 ,  G06F3/041

公开(公告)号：EP3201964A1

公开(公告)日：2017-08-09

申请号：EP14903089.2

申请日：2014-09-29

申请人： LG Display Co., Ltd.

发明人： ZHANG, Zhen ,  DRZAIC, Paul, Stephen ,  KWON, Seyeoul ,  YOUN, Sangcheon ,  YANG, Heeseok ,  LEE, Chanwoo ,  JO, Soyoung ,  HA, Anna ,  KIM, Dongyoon ,  LEE, Saemleenuri ,  CHO, Yoondong

IPC分类号： H01L51/56

CPC分类号： H04M1/0268 ,  G06F1/1652 ,  G09F9/301 ,  H01L27/3276 ,  H01L51/0097 ,  H01L51/56 ,  H01L2251/5338 ,  H05K1/028 ,  H05K1/0283 ,  H05K2201/09263 ,  H05K2201/09727 ,  H05K2201/10128

摘要： A conductive trace design is described that minimizes the possibility of crack initiation and propagation in conductive traces during bending. The conductive trace design has a winding trace pattern that is more resistant to the formation of cracks at high stress points in the conductive traces. The conductive trace design includes a cap that helps ensure electrical connection of the conductive trace even though one or more cracks may begin to form in the conductive portion of the conductive trace.