OPTIMIZATION CIRCUIT
    2.
    发明授权
    OPTIMIZATION CIRCUIT 失效
    最优化电路

    公开(公告)号:EP0708939B1

    公开(公告)日:1997-06-04

    申请号:EP94921556.0

    申请日:1994-07-13

    申请人: MITEL CORPORATION

    IPC分类号: G05F3/24

    摘要: A method of improving the performance of an active semiconductor device with a voltage-controllable channel length, comprises providing a matched reference component having similar operating characteristics to the active semiconductor device, continually monitoring the breakdown voltage of the matched reference component, and maintaining the operating voltage of the active semiconductor device to lie just below the measured breakdown voltage of the matched reference component. In this way, the performance of the active component can be optimized.

    OPTIMIZATION CIRCUIT
    3.
    发明公开
    OPTIMIZATION CIRCUIT 失效
    OPTIMIERUNGSCHALTUNG

    公开(公告)号:EP0708939A1

    公开(公告)日:1996-05-01

    申请号:EP94921556.0

    申请日:1994-07-13

    申请人: MITEL CORPORATION

    IPC分类号: G05F3 G05F1 G11C11 H03K17 H03K19

    摘要: A method of improving the performance of an active semiconductor device with a voltage-controllable channel length, comprises providing a matched reference component having similar operating characteristics to the active semiconductor device, continually monitoring the breakdown voltage of the matched reference component, and maintaining the operating voltage of the active semiconductor device to lie just below the measured breakdown voltage of the matched reference component. In this way, the performance of the active component can be optimized.