公开(公告)号：EP1417502B1

公开(公告)日：2007-10-17

申请号：EP02749176.0

申请日：2002-07-09

申请人： NXP B.V.

发明人： BIEWENGA, Alexander, S. ,  VAN DE LOGT, Leon, M., A. ,  DE JONG, Franciscus, G., M. ,  LOUSBERG, Guillaume, E., A.

IPC分类号： G01R31/3185 ,  G01R31/28

CPC分类号： G11C29/025 ,  G01R31/318547 ,  G11C29/02 ,  G11C2029/3602

摘要： An integrated circuit is switchable between a normal operating mode and a test mode. A functional circuit and a test pattern converter are both coupled between input contacts, output contacts and a redefinable contact of the integrated circuit. In the test mode respectively the test pattern converter drives the outputs contacts and, dependent on the circuit configuration, the redefinable contact. The test pattern converter is arranged to provide a first and second relation between signals at the input contacts and the output contacts, with the redefinable contact used as an input or output contact respectively, dependent on the circuit configuration. The relations have been selected so as to permit testing of stuck-at and cross-connect errors with the redefinable contact used as input and output contact respectively.