-
公开(公告)号：EP1417502B1
公开(公告)日：2007-10-17
申请号：EP02749176.0
申请日：2002-07-09
申请人： NXP B.V.
发明人： BIEWENGA, Alexander, S. , VAN DE LOGT, Leon, M., A. , DE JONG, Franciscus, G., M. , LOUSBERG, Guillaume, E., A.
IPC分类号： G01R31/3185 , G01R31/28
CPC分类号： G11C29/025 , G01R31/318547 , G11C29/02 , G11C2029/3602
摘要： An integrated circuit is switchable between a normal operating mode and a test mode. A functional circuit and a test pattern converter are both coupled between input contacts, output contacts and a redefinable contact of the integrated circuit. In the test mode respectively the test pattern converter drives the outputs contacts and, dependent on the circuit configuration, the redefinable contact. The test pattern converter is arranged to provide a first and second relation between signals at the input contacts and the output contacts, with the redefinable contact used as an input or output contact respectively, dependent on the circuit configuration. The relations have been selected so as to permit testing of stuck-at and cross-connect errors with the redefinable contact used as input and output contact respectively.
-
公开(公告)号：EP1129454B1
公开(公告)日：2009-07-08
申请号：EP00960642.7
申请日：2000-09-08
申请人： NXP B.V.
CPC分类号： G11C29/44
摘要： A memory array is tested by interfacing to a pair of a stimulus generator means for generating a sequence of row stimuli and to a response evaluator means for evaluating a sequence of responses due to the sequence of stimuli. In a non-test condition the means pair is steered in a transparent mode, in a test condition the means pair is steered in a stimulus generating mode and in a response evaluating mode, respectively, and in a subsequent repair condition row- and/or column-based repair intervention are allowed up to predetermined maximum numbers of repairable rows and columns, respectively. In particular, in the said test condition on-chip for each column tallying is done for a number of faults therein up to attaining a number of faults that exceeds the maximum number of repairable rows and then the column in question is signalled as 'must be repaired'. With respect to the signalling one or more further faults are retained that lie on a row outside a said signalled column for an associated row-based repairability. After terminating the test condition the method transfers to the repair condition through outputting the signallings and a representation of the further faults.
-
搜索结果
2 条记录 (耗时 0.008 秒)
