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    MATERIAL IDENTIFICATION USING MULTIPLE IMAGES
    1.
    发明公开
    MATERIAL IDENTIFICATION USING MULTIPLE IMAGES 审中-公开
    材料识别基于多幅影像

    公开(公告)号：EP2676243A1

    公开(公告)日：2013-12-25

    申请号：EP11728039.6

    申请日：2011-06-06

    申请人： Oxford Instruments Nanotechnology Tools Limited

    发明人： STATHAM, Peter

    IPC分类号： G06T11/00

    摘要： A computer-implemented method of image processing for materials analysis is provided. At least three image datasets are obtained, these representing intensity values of image pixels and being in common spatial registration. The image datasets are processed so as to assign a comparison measure to each pair of image datasets, the comparison measure for a given pair of image datasets being representative of the difference between the spatial intensity information within the pair. A number of image datasets are then selected using the comparison measures. A color difference measure is defined which represents the difference between pairs of colors of a color set. Colors are assigned to the selected image datasets such that pairs of the selected image datasets which have substantially different spatial intensity information are assigned respective colors which have a substantially different color difference measure. A number of the selected image datasets are then combined together to form an output color image dataset for the formation of a color image. The combination is such that each pixel of the color image takes on a color according to the relative intensities and colors of the selected image datasets so that if the pixel intensity of one dataset is substantially greater than the sum of the pixel intensities for all the other selected datasets, then the output color in the respective part of the image will substantially match the color assigned to that image dataset.

    X-RAY ANALYSIS IN AIR
    5.
    发明公开
    X-RAY ANALYSIS IN AIR 审中-公开
    RÖNTGENANALYSE在LUFT

    公开(公告)号：EP3050072A1

    公开(公告)日：2016-08-03

    申请号：EP14781263.0

    申请日：2014-09-25

    申请人： Oxford Instruments Nanotechnology Tools Limited

    发明人： STATHAM, Peter

    IPC分类号： H01J37/244 ,  H01J37/28

    CPC分类号： H01J37/244 ,  H01J37/28 ,  H01J2237/164 ,  H01J2237/182 ,  H01J2237/188 ,  H01J2237/24415 ,  H01J2237/2445 ,  H01J2237/2608

    摘要： An x-ray analysis apparatus comprises an electron beam assembly for generating a focused electron beam within a first gas pressure environment. A sample assembly is used for retaining a sample within a second gas pressure environment such that the sample receives the electron beam from the electron beam assembly and such that the gas pressure in the second gas pressure environment is greater than the gas pressure within the first gas pressure environment. An x-ray detector is positioned so as to have at least one x-ray sensor element within the first gas pressure environment. The sensor element is mounted to a part of the electron beam assembly which is proximal to the sample assembly and further arranged in use to receive x-rays generated by the interaction between the electron beam and the sample.

    摘要翻译： X射线分析装置包括用于在第一气体压力环境内产生聚焦电子束的电子束组件。 样品组件用于将样品保持在第二气体压力环境内，使得样品接收来自电子束组件的电子束，并且使得第二气体压力环境中的气体压力大于第一气体内的气体压力 压力环境。 x射线检测器定位成在第一气体压力环境内具有至少一个x射线传感器元件。 传感器元件安装到电子束组件的靠近样品组件的一部分，并且在使用中进一步布置以接收由电子束和样品之间的相互作用产生的x射线。

    METHOD OF PROCESSING A PARTICLE SPECTRUM
    6.
    发明公开
    METHOD OF PROCESSING A PARTICLE SPECTRUM 审中-公开
    方法进行处理TEILCHENSPEKTRUMS

    公开(公告)号：EP3004929A1

    公开(公告)日：2016-04-13

    申请号：EP14726733.0

    申请日：2014-05-21

    申请人： Oxford Instruments Nanotechnology Tools Limited

    发明人： STATHAM, Peter

    IPC分类号： G01T1/17 ,  G01T1/36

    CPC分类号： G01T1/36 ,  G01T1/171

    摘要： A method is provided for processing a spectrum, obtained using a particle detection system, so as to reduce spectrum artifacts arising from unresolved particle events in the detection system. An input spectrum is obtained which contains artifacts due to “pile up” in the detector. A first effect upon the input spectrum of pairs of unresolved particle events is evaluated and a first corrected input spectrum is generated which comprises the input spectrum with the first effect removed. The effect of a pairs of unresolved particle events is then evaluated for this first corrected input spectrum so as to generate a second corrected input spectrum which comprises the input spectrum with the second effect removed. An output spectrum is then generated based upon a combination of the first and second corrected input spectra. The use of the method in improving sum spectra is also discussed.