EXPOSURE PELLICLE FACILITATING ATOMSPHERIC PRESSURE ADJUSTMENT

    公开(公告)号:EP4383007A1

    公开(公告)日:2024-06-12

    申请号:EP22853079.6

    申请日:2022-08-03

    IPC分类号: G03F1/64 G03F7/20

    CPC分类号: G03F1/64 G03F7/20

    摘要: [Object] To improve the performance of a filter for a vent hole, which penetrates a pellicle frame, in response to a reduction in the maximum allowable size of foreign matter, which is required especially in EUV exposure, and to a severe change in atmospheric pressure to which a pellicle film is to be exposed.
    [Solution] A pellicle according to the present invention includes: a pellicle frame 3; a pellicle film 1 provided on an upper end surface of the pellicle frame; a vent hole 6 provided in the pellicle frame; and a filter 7 that closes the vent hole. The filter includes a non-woven fabric composed partly or entirely of at least one of nanofibers and carbon nanotubes.

    PELLICLE FRAME, PELLICLE, PHOTOMASK WITH PELLICLE, EXPOSURE METHOD, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING LIQUID CRYSTAL DISPLAY

    公开(公告)号:EP4321931A1

    公开(公告)日:2024-02-14

    申请号:EP22784593.0

    申请日:2022-03-30

    IPC分类号: G03F1/64 C09J7/38

    摘要: The purpose of the present invention is to provide a pellicle frame with an adhesive layer with which it is possible to prevent deterioration in the flatness of the adhesive layer more effectively than before, further to moderate the stress applied by a pellicle to a photomask, and as a result to reduce pellicle induced distortion (PID). The present invention provides a pellicle frame with an adhesive layer having one end surface on which a pellicle film is provided and another end surface provided with an adhesive layer for adhesion to a photomask, wherein the adhesive layer has a thickness of 0.10 to 0.30 mm, and the adhesive layer has an adhesive force of 5×10 -3 to 5×10 -1 N/cm. The present invention also provides a pellicle provided with a pellicle film on the one end surface.