摘要:
An organometallic compound which has a low melting point and excellent vaporization characteristics and can deposit a film on substrates at low temperatures; and a process for producing an iridium-containing film from the organometallic compound. A compound represented by the general formula [2] or the general formula [3]: [2] [3] is reacted with a compound represented by the general formula [4]: [4] to obtain an organoiridium compound represented by the general formula [1]: [1] [In the formulae, R1 represents hydrogen or lower alkyl; R2 represents lower alkyl; X represents halogeno; and M represents an alkali metal.] This compound is used as a raw material to produce an iridium-containing film.
摘要:
The invention relates to novel titanium complexes which have excellent vaporization characteristics and thermal stability and are useful as raw material in forming titanium-containing thin films by CVD, ALD, or the like; a process for the production of the complexes; titanium-containing thin films formed by using the complexes; and a method for formation of the films. According to the invention, a titanium complex represented by the general formula (1) is produced by reacting a diimine represented by the general formula (2) with metallic lithium and then with a tetrakisamido complex represented by the general formula (3) and a titanium-containing thin film is formed by using the titanium complex as the raw material: [Chemical formula 1] (2) [Chemical formula 2] Ti(NR 5 R 6 ) 4 (3) [Chemical formula 3] (1) wherein R 1 and R 4 are each alkyl of 1 to 6 carbon atoms, or the like; R 2 and R 3 are each independently hydrogen, alkyl of 1 to 3 carbon atoms, or the like; and R 5 and R 6 are each independently alkyl of 1 to 4 carbon atoms, or the like.
摘要:
Disclosed is a novel tantalum compound which enables to selectively form a tantalum-containing film which does not include a halogen or the like, or a tantalum-containing film which includes a desired element. Also disclosed are a method for producing such a tantalum compound, and a method for forming a tantalum-containing film which includes a desired element. Specifically disclosed is a tantalum compound represented by the general formula (1) or (2) below. [Chemical formula 1] (1) (In the formula (1), R 1 represents a straight-chain alkyl group having 2-6 carbon atoms.) [Chemical formula 2] (2) (In the formula (2), R 2 represents a straight-chain alkyl group having 2-6 carbon atoms.) Also specifically disclosed is a method for forming a tantalum-containing film by using a tantalum compound represented by the general formula (6) below as a raw material. [Chemical formula 3] (6) (In the formula (6), j, k, m and n respectively represent an integer of 1-4 satisfying j + k = 5 and m + n = 5; and R 3 -R 6 respectively represent a hydrogen atom, an alkyl group having 1-6 carbon atoms or the like.)
摘要:
To provide a composition with which a metal film can be directly produced from a high-valent metal compound, a method for producing a metal film, and a method for producing a metal powder. Using a composition for production of a metal film of copper, silver or indium, which comprises a high-valent compound of copper, silver or indium, a linear, branched or cyclic C 1-18 alcohol and a Group VIII metal catalyst, a coating film is formed, followed by reduction by heating to produce a metal film of copper, silver or indium. Further, using metal particles of silver, copper of indium having a surface layer comprising a high-valent compound of copper, silver or indium, instead of the high-valent compound of copper, silver or indium, a metal film of copper, silver or indium is produced in the same manner as above.
摘要:
For forming a thin ruthenium film of good quality by CVD method, it is necessary to form the thin film at low temperature. There hence is a desire for a ruthenium compound having a high reactivity to heat. This invention relates to a method of producing a ruthenium-containing film by CVD or the like using, as a raw material, a ruthenium complex mixture containing (2,4-dimethylpentadienyl)(ethylcyclopentadienyl)ruthenium and bis(2,4-dimethylpentadienyl)ruthenium, the amount of the latter compound being 0.1 to 100% by weight based on the weight of (2,4-dimethylpentadienyl)(ethylcyclopentadienyl)ruthenium, and the like.
摘要:
An object of the present invention is to provide a method for producing a Group IV metal oxide film useful as a semiconductor element or an optical element at a low temperature. The present invention relates to a method for producing a Group IV metal oxide film, comprising coating a surface of a substrate with a film-forming material dissolved in an organic solvent, and subjecting the substrate to a heat treatment, an ultraviolet irradiation treatment, or both of these treatments, wherein a film-forming material obtained by reacting a vinylenediamide complex having a specific structure with an oxidizing agent such as oxygen gas, air, ozone, water and hydrogen peroxide is used as the film-forming material.