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公开(公告)号：EP1829218A2
公开(公告)日：2007-09-05
申请号：EP05854789.4
申请日：2005-12-16
申请人： Teradyne, Inc.
CPC分类号： H03M1/1071
摘要： In one aspect, the invention is an integrated circuit (IC) for use in testing an analog-to-digital (ADC) converter includes a first channel of a parametric measurement unit (PMU) configured to send a force signal to the ADC. The IC also includes a first digital-to-analog converter (DAC) connected to the first channel of the PMU. The DAC has a DC level of accuracy of less than 1 millivolt.In another aspect, the invention is an integrated circuit (IC) for use in testing a digital-to-analog-converter-device-under-test (DACDUT). The IC includes a first channel of a parametric measurement unit (PMU) configured to send a force signal to the DACDUT and including an output port for taking measurements, a first digital-to-analog converter (DAC) connected to the first channel of the PMU and a PMU measurement path connected to the output port having a DC level of accuracy of less than 1 mV.
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2.发明公开USING PARAMETRIC MEASUREMENT UNITS AS A SOURCE OF POWER FOR A DEVICE UNDER TEST 审中-公开要检查参数测量单元作为动力源对设备的使用
公开(公告)号：EP1825280A2
公开(公告)日：2007-08-29
申请号：EP05854436.2
申请日：2005-12-16
申请人： Teradyne, Inc.
CPC分类号： G01R31/2886 , G01R31/2839 , G01R31/2889 , G01R31/3004
摘要： An apparatus for providing current to a device under test includes a first parametric measurement unit configured to provide current to the device, and a second parametric measurement unit configured to provide current to the device. The current from the second parametric measurement unit augments the current from the first parametric measurement unit at the device.
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公开(公告)号：EP1927210A2
公开(公告)日：2008-06-04
申请号：EP06815244.6
申请日：2006-09-22
申请人： Teradyne, Inc.
IPC分类号： H04L7/00
CPC分类号： G01R31/31937 , G01R31/31726 , G11C29/56 , G11C29/56004 , G11C29/56012
摘要： A method and apparatus is provided to recover clock information embedded in a digital signal such as a digital signal A set of strobe pulses can be generated by routing an edge generator to a delay elements with incrementally increasing delay values A set of latches triggered by incrementally delayed signals from the edge generator can capture samples of the data signal An encoder (84) can convert the samples to a word representing edge time and polarity of the sampled signal The word representing edge time can be stored in memory (86) An accumulator can collect the average edge time over N samples (88) The average edge time can be adjusted with a fixed de-skew value to form the extracted clock information The extracted clock information can be used as pointer to the words stored in memory
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4.发明公开
公开(公告)号：EP1864144A2
公开(公告)日：2007-12-12
申请号：EP05854349.7
申请日：2005-12-16
申请人： Teradyne, Inc.
IPC分类号： G01R31/26
CPC分类号： G01R31/31924
摘要： A method of and system for producing signals to test semiconductor devices includes a pin electronic (PE) stage for providing a parametric measurement unit (PMU) current test signal to a semiconductor device under test. The PE stage also senses a response from the semiconductor device under test.
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公开(公告)号：EP1849018A2
公开(公告)日：2007-10-31
申请号：EP05854966.8
申请日：2005-12-16
申请人： Teradyne, Inc.
CPC分类号： G01R31/2844
摘要： In one aspect, the invention is an integrated circuit (IC) for use in testing a device. The IC includes a pin electronics (PE) driver having an output and a pin. The IC also includes a buffer connected to the output of the PE driver and the pin. The first voltage measured at the pin is greater than a second voltage measured at the output. The IC may include a first amplifier having an input connected to a voltage source. The IC may also include a second amplifier having an input connected to the output of the PE driver.
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公开(公告)号：EP1828789A2
公开(公告)日：2007-09-05
申请号：EP05854348.9
申请日：2005-12-16
申请人： Teradyne, Inc.
IPC分类号： G01R31/26
CPC分类号： G01R31/31924
摘要： A semiconductor device tester includes a parametric measurement unit (PMU) stage for producing a DC test signal and a pin electronics (PE) stage for producing an AC test signal to test a semiconductor device. A driver circuit is capable of providing a version of the DC test signal and a version of the AC test signal to the semiconductor device.
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