AXIAL ION SOURCE WITH MAGNETIC FIELD ADJUSTMENT

    公开(公告)号:EP4498402A3

    公开(公告)日:2025-02-19

    申请号:EP24188836.1

    申请日:2024-07-16

    Abstract: Systems and methods taught herein generate a non-uniform magnetic field in the ionization region of an ion source to improve robustness in electrical and chemical ionization processes, particularly negative chemical ionization (CI) processes. The non-uniform magnetic field within the ionization volume spatially separates electrons and anions such that anions primarily pass through an ion exit aperture in the ionization chamber while electrons are directed to strike side walls or end walls of the ionization chamber away from the ion exit aperture. As a result, greater numbers of ions exit from the ion source towards a mass analyzer. Systems and methods taught herein also increase the longevity of instrumentation by avoiding damage that can be caused by electrons striking surfaces around apertures.

    AXIAL ION SOURCE WITH MAGNETIC FIELD ADJUSTMENT

    公开(公告)号:EP4498402A2

    公开(公告)日:2025-01-29

    申请号:EP24188836.1

    申请日:2024-07-16

    Abstract: Systems and methods taught herein generate a non-uniform magnetic field in the ionization region of an ion source to improve robustness in electrical and chemical ionization processes, particularly negative chemical ionization (CI) processes. The non-uniform magnetic field within the ionization volume spatially separates electrons and anions such that anions primarily pass through an ion exit aperture in the ionization chamber while electrons are directed to strike side walls or end walls of the ionization chamber away from the ion exit aperture. As a result, greater numbers of ions exit from the ion source towards a mass analyzer. Systems and methods taught herein also increase the longevity of instrumentation by avoiding damage that can be caused by electrons striking surfaces around apertures.

    DEVICE GEOMETRIES FOR CONTROLLING MASS SPECTROMETER PRESSURES

    公开(公告)号:EP4105965A1

    公开(公告)日:2022-12-21

    申请号:EP22179582.6

    申请日:2022-06-17

    Abstract: A mass spectrometer collision cell system, comprising: a gas containment vessel comprising an internal chamber having ion inlet and ion outlet ends and a cross-sectional area, A chamber ; a gas inlet aperture; first and second gas outlet apertures that are disposed at or proximal to the ion inlet and outlet ends, respectively, and that have respective outlet aperture cross-sectional areas, A aperture1 and A aperture2 , and an average outlet aperture cross-sectional area, A aperture ave , a longitudinal axis of the chamber extending from the ion inlet end to the ion outlet end and having a length, L chamber ; and a set of multipole rod electrodes, at least a portion of each multipole rod electrode being within the chamber, wherein the values of A chamber , L chamber and A aperture ave are such that the combined gas conductance of the chamber and the gas outlet apertures is not greater than 95 percent of the gas conductance of the gas outlet apertures alone

    TUNING MULTIPOLE RF AMPLITUDE FOR IONS NOT PRESENT IN CALIBRANT

    公开(公告)号:EP3435404A1

    公开(公告)日:2019-01-30

    申请号:EP18186077.6

    申请日:2018-07-27

    Abstract: A mass spectrometry apparatus includes an ion source configured to generate ions; an ion guide configured to guide ions from the ion source towards a detector; the ion detector configured to detect ions; and a mass spectrometry controller. The mass spectrometry controller is configured to generate a tune curve for the ion guide; determine an observed low mass cutoff for the ion guide from the tune curve; calculate an effective r0 for the ion guide based on the observed low mass cutoff; determine an RF voltage based on the effective r0; apply the RF voltage to the ion guide; and perform a mass analysis of ions in a sample.

    SIMPLIFIED SOURCE CONTROL INTERFACE FOR MASS SPECTROMETRY

    公开(公告)号:EP3343589A1

    公开(公告)日:2018-07-04

    申请号:EP17209146.4

    申请日:2017-12-20

    Abstract: A mass spectrometry system having a simplified control interface includes a processor and a memory. The memory includes instructions that when executed cause the processor to perform the steps of providing a user interface including a plurality of adjustment elements for adjusting at least one results effective parameter and at least one sample descriptive parameter; determining a plurality of instrument control parameters based on the at least one results effective parameter and the at least one sample descriptive parameter; and analyzing a sample while operating according to the plurality of instrument control parameters.

    INTERNAL SOLVENT TRAP WITH DRAIN
    7.
    发明公开
    INTERNAL SOLVENT TRAP WITH DRAIN 审中-公开
    内部溶剂陷阱与漏

    公开(公告)号:EP3244439A1

    公开(公告)日:2017-11-15

    申请号:EP17170105.5

    申请日:2017-05-09

    Abstract: A solvent trap for integration with a mass spectrometry system includes an enclosure defining an internal space; a wet gas inlet port configured to receive a gaseous flow from an ion source; a liquids outlet port configured to enable liquids to flow under gravity from the internal space; and a dry gas outlet port configured to exhaust gas from the internal space.

    Abstract translation: 用于与质谱系统集成的溶剂捕集器包括限定内部空间的外壳; 湿气入口,其被配置为接收来自离子源的气流; 液体出口端口,所述液体出口端口构造成使液体能够在重力作用下从内部空间流动 以及构造成从内部空间排出气体的干燥气体出口端口。

    IMPROVING ION TRANSFER TUBE FLOW AND PUMPING SYSTEM LOAD

    公开(公告)号:EP3196923A3

    公开(公告)日:2017-11-15

    申请号:EP17151876.4

    申请日:2017-01-17

    Abstract: A mass spectrometer system can include an ion source, a vacuum chamber; a mass analyzer within the vacuum chamber, a transfer tube between the ion source and the vacuum chamber, a transfer tube heater, and a vacuum pump. The mass spectrometer system can be configured to reduce the pump speed of the vacuum pump in response to receiving a transfer tube swap instruction; lower the temperature of the transfer tube to below a first threshold; operating the vacuum pump at the reduced pump speed while the transfer tube is replaced with a second transfer tube; heating the second transfer tube to a temperature above a pump down temperature; and increasing the pump speed of the vacuum pump after the temperature of the second transfer tube exceeds a second threshold.

    DUCTING GAS OF MASS SPECTROMETER
    9.
    发明公开

    公开(公告)号:EP4358115A1

    公开(公告)日:2024-04-24

    申请号:EP23202802.7

    申请日:2023-10-10

    CPC classification number: H01J49/24 H01J49/067 H01J49/0045

    Abstract: A mass spectrometer includes a vacuum chamber, a pump for maintaining a vacuum chamber at an operating vacuum pressure, an ion source, a first mass filter configured to select precursor ions, a collision/reaction cell pressurized with a collision or reaction gas and configured to generate a plurality of product ions from the precursor ions by colliding or reacting the precursor ions with one or more gas particles, and a second mass filter configured to select target ions from the product ions. Also provided are entrance and exit lenses between the collision/reaction cell and the first and second mass filters, respectively, each of which include axially-spaced ion lenses and evacuation chambers between adjacent ion lenses. A plenum fluidly connects the evacuation chambers to the pump inlet to facilitate evacuation of collision or reaction gas escaping the collision/reaction cell to the pump away from the first and second mass filters.

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