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公开(公告)号：EP3264027A1
公开(公告)日：2018-01-03
申请号：EP16772412.9
申请日：2016-03-18
CPC分类号： G01B5/20 , G01B5/201 , G01B5/28 , G01B2210/54
摘要： The present invention has a first object to efficiently use data acquired by roundness measurement for surface roughness measurement to reduce a measurement workload and improve measurement efficiency and the like, and a second object to not only improve measurement efficiency of roundness measurement and surface roughness measurement, but also mutually use data acquired by each of the roundness measurement and the surface roughness measurement for roundness measurement data and surface roughness measurement data to improve measurement accuracy, for example. To achieve the first object, measurement conditions in surface roughness measurement are set on the basis of data on a measuring object acquired by roundness measurement. To achieve the second object, there are provide a first measurement unit that performs roundness measurement of the measuring object, and a second measurement unit that performs surface roughness measurement of measuring object at a position opposite to the first measurement unit in the circumferential direction, and the roundness measurement by the first measurement unit and the surface roughness measurement by the second measurement unit are simultaneously performed.
摘要翻译： 本发明的第一个目的是有效利用通过圆度测量获得的数据用于表面粗糙度测量，以减少测量工作量并提高测量效率等，第二个目的是不仅提高圆度测量和表面粗糙度测量的测量效率， 而且相互使用通过圆度测量和表面粗糙度测量中的每一个获取的数据用于圆度测量数据和表面粗糙度测量数据以提高测量精度。 为了实现第一个目的，表面粗糙度测量中的测量条件基于通过圆度测量获得的测量对象的数据来设置。 为了实现第二目的，提供了执行测量对象的圆度测量的第一测量单元以及在周向方向上与第一测量单元相对的位置处执行测量对象的表面粗糙度测量的第二测量单元，以及 同时执行第一测量单元的圆度测量和第二测量单元的表面粗糙度测量。
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公开(公告)号：EP3598058A1
公开(公告)日：2020-01-22
申请号：EP19195689.5
申请日：2016-03-18
摘要： The present invention has for object to efficiently use data acquired by roundness measurement for surface roughness measurement to reduce a measurement workload and improve measurement efficiency and the like. To achieve this object, measurement conditions in surface roughness measurement are set on the basis of data on a measuring object acquired by roundness measurement.
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