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公开(公告)号：EP3736527A1
公开(公告)日：2020-11-11
申请号：EP18905650.0
申请日：2018-11-02
发明人： TAKANASHI, Ryo
摘要： There is provided a surface shape measurement device which can simultaneously measure a surface roughness of a measurement target surface and surface shapes other than the surface roughness of the measurement target surface, and prevent a sensing pin from being damaged. The present invention comprises: a detector; a first elastic support member which supports the detector swingably in a first rotation direction and in a second rotation direction opposite to the first rotation direction; a drive part which moves the first elastic support member along a driving direction which is orthogonal to an axis direction of a swing fulcrum and parallel to the measurement target surface; a detector guide which has a linear shape and guides the detector driven by the drive part via the first elastic support member along the measurement target surface; a guide support member which has one or multiple first contact points in contact with the measurement target surface and supports the detector guide at a position facing a surface of the detector opposite to a surface of the detector facing the measurement target surface; and a detector support member which is provided to the detector and causes the detector guide to support the detector movably along the detector guide.
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公开(公告)号：EP3441716A1
公开(公告)日：2019-02-13
申请号：EP17779041.7
申请日：2017-03-30
发明人： TAKANASHI, Ryo
摘要： There is provided a workpiece supporting device which is able to reduce the deflection of the workpiece at a low cost. A workpiece supporting device for a shape measuring device which measures a shape of a workpiece, includes: a horizontal table; three first fulcrums provided on an upper surface of the table; first arms swingably supported by the respective first fulcrums, each of the first arms swingably supported at a central part in a longitudinal direction of the first arm by the first fulcrum; and a plurality of first contacting parts swingably provided on an upper surface of the first arm for each first fulcrum and distributed from the first fulcrum in different directions, the first contacting parts configured to come into contact with the workpiece.
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公开(公告)号：EP3239654B1
公开(公告)日：2018-11-14
申请号：EP16743094.1
申请日：2016-01-12
发明人： TAKANASHI, Ryo
摘要： A roundness measurement device 1 according to the present invention includes a base 10, a stage 12 provided on the base 10 and configured to place a workpiece W thereon, a column 14 elected on the base 10, a carriage 16 supported movably along the column 14, a turning arm 18 supported by the carriage 16 turnably around a pivot axis in a radial direction (left-right direction), a radial direction moving arm 20 supported movably in the radial direction, and a detector holder 22 fixed to a tip end of the radial direction moving arm 20. A detector 24 is held by the detector holder 22, and a position of the detector in the radial direction is adjusted by movement of the radial direction moving arm 20 in the radial direction.
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公开(公告)号：EP3264027A1
公开(公告)日：2018-01-03
申请号：EP16772412.9
申请日：2016-03-18
CPC分类号： G01B5/20 , G01B5/201 , G01B5/28 , G01B2210/54
摘要： The present invention has a first object to efficiently use data acquired by roundness measurement for surface roughness measurement to reduce a measurement workload and improve measurement efficiency and the like, and a second object to not only improve measurement efficiency of roundness measurement and surface roughness measurement, but also mutually use data acquired by each of the roundness measurement and the surface roughness measurement for roundness measurement data and surface roughness measurement data to improve measurement accuracy, for example. To achieve the first object, measurement conditions in surface roughness measurement are set on the basis of data on a measuring object acquired by roundness measurement. To achieve the second object, there are provide a first measurement unit that performs roundness measurement of the measuring object, and a second measurement unit that performs surface roughness measurement of measuring object at a position opposite to the first measurement unit in the circumferential direction, and the roundness measurement by the first measurement unit and the surface roughness measurement by the second measurement unit are simultaneously performed.
摘要翻译： 本发明的第一个目的是有效利用通过圆度测量获得的数据用于表面粗糙度测量，以减少测量工作量并提高测量效率等，第二个目的是不仅提高圆度测量和表面粗糙度测量的测量效率， 而且相互使用通过圆度测量和表面粗糙度测量中的每一个获取的数据用于圆度测量数据和表面粗糙度测量数据以提高测量精度。 为了实现第一个目的，表面粗糙度测量中的测量条件基于通过圆度测量获得的测量对象的数据来设置。 为了实现第二目的，提供了执行测量对象的圆度测量的第一测量单元以及在周向方向上与第一测量单元相对的位置处执行测量对象的表面粗糙度测量的第二测量单元，以及 同时执行第一测量单元的圆度测量和第二测量单元的表面粗糙度测量。
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公开(公告)号：EP1988356A1
公开(公告)日：2008-11-05
申请号：EP07706708.0
申请日：2007-01-05
发明人： TAKANASHI, Ryo
IPC分类号： G01B5/00
CPC分类号： G01B7/001
摘要： A displacement detector capable of making a measurement in two directions of measurement 180 degrees different from each other without the need of a switching operation has been disclosed. This displacement detector comprises a contact arm 41 supported rotatably at a fulcrum of extension and rotation 43, first and second contacts 42A, 42B provided to the contact arm, first and second arms 21A, 21B each one end of which comes into contact with the contact arm 41, a first detection element 25 of the first arm, a second detection element 26 of the second arm, a detection section that detects the positional relationship between the first and second detection elements, a first biasing means 24A of the first arm, a second biasing means 24B of the second arm, a first stopper 30A of the first arm, and a second stopper 30B of the second arm, and a reference rotation position is a state in which the first and second arms are in contact with the first and second stoppers and also in contact with the contact arm, and when the contact arm rotates from the reference rotation position in a first or second direction, the first or second arm enters a free state.
摘要翻译： 已经公开了能够在不需要切换操作的情况下彼此不同的180度的测量方向上进行测量的位移检测器。 该位移检测器包括可旋转地支撑在延伸和旋转支点43处的接触臂41，设置在接触臂上的第一和第二接触件42A，42B，第一和第二臂21A，21B，每个端部与触点接触 臂41，第一臂的第一检测元件25，第二臂的第二检测元件26，检测第一和第二检测元件之间的位置关系的检测部，第一臂的第一施力单元24A， 第二臂的第二偏压装置24B，第一臂的第一止动件30A和第二臂的第二止动件30B，基准旋转位置是第一和第二臂与第一臂和第二臂接触的状态， 第二止动件并且还与接触臂接触，并且当接触臂在第一或第二方向上从基准旋转位置旋转时，第一或第二臂进入自由状态。
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公开(公告)号：EP3598058A1
公开(公告)日：2020-01-22
申请号：EP19195689.5
申请日：2016-03-18
摘要： The present invention has for object to efficiently use data acquired by roundness measurement for surface roughness measurement to reduce a measurement workload and improve measurement efficiency and the like. To achieve this object, measurement conditions in surface roughness measurement are set on the basis of data on a measuring object acquired by roundness measurement.
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公开(公告)号：EP3239654A1
公开(公告)日：2017-11-01
申请号：EP16743094.1
申请日：2016-01-12
发明人： TAKANASHI, Ryo
摘要： A roundness measurement device 1 according to the present invention includes a base 10, a stage 12 provided on the base 10 and configured to place a workpiece W thereon, a column 14 elected on the base 10, a carriage 16 supported movably along the column 14, a turning arm 18 supported by the carriage 16 turnably around a pivot axis in a radial direction (left-right direction), a radial direction moving arm 20 supported movably in the radial direction, and a detector holder 22 fixed to a tip end of the radial direction moving arm 20. A detector 24 is held by the detector holder 22, and a position of the detector in the radial direction is adjusted by movement of the radial direction moving arm 20 in the radial direction.
摘要翻译： 根据本发明的圆度测量装置1包括基座10，设置在基座10上并用于放置工件W的工作台12，在基座10上选出的支柱14，沿支柱14可移动地支承的滑架16 以能够绕半径方向（左右方向）的转动轴线转动的方式由滑架16支承的转动臂18，能够在半径方向上移动自如地支承的径向移动臂20，以及固定在该转动臂20的前端 径向移动臂20.检测器24由检测器支架22保持，并且通过径向移动臂20沿径向的移动来调节检测器在径向方向上的位置。
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公开(公告)号：EP1988356B1
公开(公告)日：2016-04-13
申请号：EP07706708.0
申请日：2007-01-05
发明人： TAKANASHI, Ryo
CPC分类号： G01B7/001
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